Atomic force microscopy triblock copolymer images

Figure 2.12 (a) Atomic force microscopy tapping phase image of surface, and (b) TEM image of cross-section for triblock copolymer with I EC of 1.28 mEq./g. Reproduced with permission from Ref. [ 174]. 

With atomic force microscopy, Tong et al. compared the morphology of some poly(methylmethacrylate)-/ -poly(alkylacrylate)-/ -poly(methylmethacrylate) triblock copolymers, namely poly(methylmethacrylate)-fc-poly(isooctyl acrylate)-/ -poly(methylmethacrylate) (MIM), poly(methylmethacrylate)-fc-poly (n-butylacrylate)-/ -poly(methylmethacrylate) (MnBM), poly(methyhnethacrylate)-fc-poly(n-propylacrylate)-fc-poly(methyl methacrylate) (MnPM), and poly (methylmethacrylate)-/ - and poly(ethylacrylate)-/ -poly(methyhnethacrylate) (MEM), using a procedure designed to image microdomains of different mechanical properties. The amplitude and phase of the oscillating tip were recorded simultaneously at each point of the surface, with a lateral resolution of a few nanometers. 

Figure 21.10 SEC of a linear ABC poly (HEVE-Z7-CEVE-Z7-CDVE) 4 linear triblock copolymer (sample l-2. Table 21.1) and of the corresponding copolymer after cyclization (C-2). P is the fraction of linears that are formed through CDVE coupling, l-2 and d-2 are remaining linears and polycondensates (mainly dimers). (Reprinted with permission from M. Schappacher and A. Deffieux, Atomic force microscopy imaging and dilute solution properties of cyclic and linear polystyrene combs, Journal of the American Chemical Society, 130, 14684-14689, 2008. 2008 American Chemical Society.)...

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