Atomic force microscopy structural information from

The most important distinction between the two structures is that only the helical model is compatible with all of the published structural data, including results obtained from limited proteolysis [81,83], chemical cross-linking [83], analytical ultracentrifugation [81], and mutant complementation [84,85]. Although the double helix provides a useful model with good predictive power, it will no doubt be subjected to further investigation by, for example, atomic force microscopy or X-ray crystallography. Such experiments should refine the structural information on PKSs, and point the way toward the productive modification and immobilization of the synthases. 

Surface and structural properties of nanoporous solids can be studied directly by employing modem techniques such as atomic force microscopy, electron microscopy, X-ray analysis and various spectroscopic methods suitable for materials characterization and surface imping [4]. In addition, these properties can be investigated by indirect methods such as adsorption [1, 11-13], chromatography [14, 15] and thermal analysis [16]. The quantities evaluated from adsorption, chromatographic and thermodesorption data provide information about the whole adsorbent-adsorbate system. These data can by used mainly to extract... 

From a methodological point of view, of particularly interest have been improvements in the chemical sensitivity of STM and AFM characterization. This is especially desirable for electrochemists, as electrochemical environments prevent the combined characterization by other surface techniques, as are frequently used for composition determinations in vacuum. Tunneling spectroscopy measurements to obtain 7 y and d//dV y relationships may provide a certain degree of information regarding the electronic structure of the substrate surface and adsorbed molecules [77], and the use of ionic liquids of large electrochemical windows is favorable in this respect. One major enhancement would be to complement SPM with other spatial, time- and energy-resolved surface in-situ techniques. For example, a combination of scanning electrochemical microscopy and atomic force microscopy... 

---