Atomic force microscopy electrochemical applications

Despite H/D kinetic isotope studies, application of modern techniques such as atomic force microscopy (AFM), electrochemical mass spectrometry (EMS) [60], and electrochemical quartz microbalance (EQCM), the mechanism of electroless nickel and cobalt, whatever reducing agent is involved, continues to be the subject of much discussion and varying opinions. 

I) Faradaic electrochemical methods. From a general analytical point of view, electrochemical techniques are very sensitive methods for identifying and determining the electroactive species present in the sample and, in addition, they also are able to carry out speciation studies, providing a complete description of the states of oxidation in which the ionic species are present in the object. Other applications and improvements obtained by their hyphenation with other instrumental techniques, such as atomic force microscopy (AFM), will be described in the following chapters. 

The application of novel in situ spectroscopic techniques for the study of Li electrodes in solutions should also be acknowledged. These include FTIR spectroscopy [108], atomic force microscopy (AFM) [109], electrochemical quartz crystal microbalance (EQCM) [110], Raman spectroscopy [111], and XRD [83],... 

The development of local probe techniques such as Scanning Tunneling Microscopy (STM) or Atomic Force Microscopy (AFM) and related methods during the past fifteen years (Nobel price for physics 1986 to H. Rohrer and G. Binning) has opened a new window to locally study of interface phenomena on solid state surfaces (metals, semiconductors, superconductors, polymers, ionic conductors, insulators etc.) at an atomic level. The in-situ application of local probe methods in different systems (UHV, gas, or electrochemical conditions) belongs to modem nanotechnology and has two different aspects. 

Dobson, P. S. Weaver, J. M. R. Burt, D. P et al. 2006. Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes Fabrication method and application to high resolution imaging on heterogeneously active surfaces. Phys. Chem. Chem. Phys. 8 3909-3914. 

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