Potential Spectroscopy

APS Appearance potential spectroscopy (see AES) Intensity of emitted x-ray or Auger electrons is measured as a function of incident electron energy Surface composition... [Pg.316]

AES = auger electron spectroscopy APS = appearance potential spectroscopy CEELS = characteristic electron energy-loss spectroscopy ... [Pg.398]

AEAPS Auger electron appearance potential spectroscopy... [Pg.4]

Auger Electron Appearance Potential Spectroscopy (AEAPS)... [Pg.83]

D.R. Chopra, Appearance potential spectroscopy of lanthanides and their intermetallics 519 Author index 547... [Pg.458]

Soft X-ray appearance potential spectroscopy. Another name for APXPS. [Pg.526]

AEAPS Auger Electron Appearance Potential Spectroscopy The EAPFS cross-section is monitored by Auger electron intensity. Also known as APAES. [Pg.6]

There are three main detection modes for EAPFS within the appearance potential spectroscopy (APS) technique./31/ First, one may monitor soft-x-ray emission due to the decay of the core hole left by the primary process. This is called SXAPS-EAPFS (Figure le). Second, it is also possible to monitor Auger electrons due to the same core-hole decay, as in AEAPS-EAPFS and AMEFS-EAPFS, cf. Figure If. Third, one may measure the remaining total intensity of... [Pg.52]

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