Adsorption on Flat Surfaces of Dielectrics and Semiconductors

Adsorbed layers on flat, transparent substrates can be studied by transmission, IRRAS, and ATR methods. Historically the first measurements were by the 

ULTRATHIN FILMS AT GAS-SOLID, GAS-LIQUID, AND SOLID-LIQUID INTERFACES 

The adsorption kinetics of a mixture of surfactants (sodium dodecyl sulfate and sodium laurate) onto a vacuum-deposited AI2O3 film and diphenylchlorosi-lane [322] and phthalocyanines [323] on chemically deposited silicon oxide on silicon was also studied [324], Coated ATR was also effective in the IR spectroscopic studies of adsorption on polymers (Section 7.7). 

IRRAS is the leading spectroscopy for characterizing the structure and properties of monolayers adsorbed at the air-water interface (Section 4.8). Research activity in this area [332-334] is largely motivated by the potential applications of transferred Langmuir (L) monolayers in molecular electronics and nonlinear optics and by fundamental interest in the organization and dynamics of quasi 

Technique and Conditions Xanthate and Snlflde Minimum Detectable Surface CovCTage References 

---