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Xerographic Spectroscopy of States in Mobility Gap

Mobility measurements by the TOP methods considered in Chapters 3 and 4 are particularly important, but they cannot give information about the whole spectrum of states in the mobility gap of amorphous chalcogenides. Therefore, in addition to TOP, XTOP, IPTOP, TSC, and TSDC, other complimentary techniques that probe the gap states are needed. Xerographic techniques that were initially developed to characterize properties of electrophotographic (xerographic) receptors [1] seemed to be informative, suitable, and widely applicable for the study of amorphous thin films and photoconductive insulator thin films [2], [Pg.79]

Por further consideration of such a powerful instrument, it is helpful to provide information about the xerographic process (although the latter is well described in the scientific literature). [Pg.79]

Copyright 2010 by Elsevier Inc. All rights of reproduction in any form reserved. [Pg.79]

See other pages where Xerographic Spectroscopy of States in Mobility Gap is mentioned: [Pg.79]    [Pg.81]    [Pg.83]    [Pg.85]    [Pg.87]    [Pg.89]    [Pg.91]    [Pg.93]    [Pg.79]    [Pg.81]    [Pg.83]    [Pg.85]    [Pg.87]    [Pg.89]    [Pg.91]    [Pg.93]   


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