X-ray photoelectron spectroscopic analysis

Table VI. X-ray photoelectron spectroscopic analysis of corrosion film on microanalysis samples...

Table VIII. X-ray Photoelectron Spectroscopic Analysis Of Nitric Acid-Treated Polyetherimide Following Cleaning.

Wang, S.-J., I.-S. Jin, and H.-H. Park. 1998. X-ray photoelectron spectroscopic analysis on plasma-etched Si02 aerogel with CHF3 gas. Surface arui Coatings Technology 100-101 59-64. 

Figure 12.13. X-ray photoelectron spectroscopic analysis of the surface of V/Ti catalysts atomic ratios of fresh, calcined, used and aged catalysts indicating a change in the surface concentration of the active component.

Liu B, Fang Y, Terano M High resolution X-ray photoelectron spectroscopic analysis of transformation ofsur ce chromium species onPhiUips CrOx/Si02 catalysts isothermally calcined at various temperatures, J Mol Catal A Chem 219(1) 165—173, 2004a. 

D.Briggs and M.P. Sykh. Analysis of Surface by Auger- and X-ray Photoelectron Spectroscope. Mir, Moscow. 1987. 

A model P4-18-SPM scanning tunneling microscope (NT-MDT, Russia) was employed to investigate the structure, in atmosphere, of nanometer-scale thin film materials and also to measure the thickness of the film. A setup [28] combining electrochemical studies and X-ray photoelectron spectroscopic (XPS) analysis served to characterize the surface composition of alloy films. 

X-ray photoelectron spectroscopic(XPS) analysis with argon-etching gives surface and depth profile of catalyst composition[20]. Figure 2 shows enriched Te-content at surface of Te/Mo=... 

AFM topographic images. X-ray photoelectron spectroscopic (XPS) analysis, and ellipsometric and contact angle with water droplet (Table 3.2) measurements... 

Fig. 19.68 X-ray photoelectron spectroscopic (XPS) analysis of passive iron oxide layers form in the presence of doped polyaniline. (From Ref. 83.)...

Xia et al. [39] have found that out of these three catalysts only the Cu-CPSIL is effective for the reaction of aliphatic bromides with sodium azide and alkyne to produce 1,2 -triazoles under the optimized condition as the copper on CPSIL showed high dispersion and the interaction between the copper and support is different in case of Cu-CPSlL than the other two as evidenced by the X-ray photoelectronic spectroscopic (XPS) analysis. Based on experimental evidences and literature reports [40,41]/ they provide a possible pathway for this transformation as depicted in Scheme 23. 

X-ray photoelectron spectroscopic (XPS) analysis has shown that the surface modification indeed suppresses the formation of thick SEI layers and thereby improves the rate capability [89]. 

All of the alumoxanes prepared from boehmite decompose between 180 and 385 °C to give AI2O3 in essentially quantitative yield. XRD spectra of the residues are consistent with their identity as y-alumina. Based on X-ray photoelectron spectroscopic (XPS) analysis, carbon incorporation is found to be very low if the pyrolysis is carried out in an oxidizing atmosphere. 

To verify chemical stability of the coated SPPOBr layer any chemical under the testing conditions. X-ray photoelectron spectroscopic (XPS) analysis was conducted on flat sheet TFC membranes coated with SPPOBr. The analyses were performed before and after 10 days exposure of the membranes to the experimental conditions. The results of XPS analysis are shown in Table 29. 

The interface properties can usually be independently measured by a number of spectroscopic and surface analysis techniques such as secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), specular neutron reflection (SNR), forward recoil spectroscopy (FRES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM), infrared (IR) and several other methods. Theoretical and computer simulation methods can also be used to evaluate H t). Thus, we assume for each interface that we have the ability to measure H t) at different times and that the function is well defined in terms of microscopic properties. 

Further structural information is available from physical methods of surface analysis such as scanning electron microscopy (SEM), X-ray photoelectron or Auger electron spectroscopy (XPS), or secondary-ion mass spectrometry (SIMS), and transmission or reflectance IR and UV/VIS spectroscopy. The application of both electroanalytical and surface spectroscopic methods has been thoroughly reviewed and appropriate methods are given in most of the references of this chapter. 

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