White light interferometry

Shang, H.-T., 1981, Chromatic dispersion measurement by white light interferometry on meter-length single-mode optical fiber, J. Opt. Soc. Am., 71, 1587... 

The interferometric measurements with RIfS can be parallelized as demonstrated in Figure 18. In this case, instead of white light interferometry, only a few wavelengths are used to allow parallel detection of all measurement dots. A filter wheel selects one wavelength at a time from the white light source, while the CCD camera monitors the intensity distribution at the transducer for all spots, in this case in a microtiter plate35. 

White light interferometry was employed to inspect the stamps and replicates used in this research in device fabrication. The Wyko NT3300 surface profiler is a commercially available inspection system equipped with hardware and software for data acquisition and analysis (www.veeco.com). The metrology system has 0.1 nm resolution in the vertical (z) axis. Laterally, in the XY plane, resolution is dependent on the pixel size in each scan. Thus, the objective and field of view of the scan determines lateral resolution. Scans in this study were performed using 20.8x effective magnification, translating to 0.7 pm pixel size. Considering the size scale of the structures involved, this lateral resolution was... 

Manoli K, Goustouridis D, Chatzandroulis S, Raptis 1, Valamontes ES, Sanopoulou M (2006) Vapor sorption in thin supported polymer films studied by white light interferometry. Polymer 47 6117-6122 Matsuguchi M, Okamoto A, Sakai Y (2003) Effect of humidity on NH3 gas sensitivity of polyaniline blend films. Sens Actuators B 94 46-52... 

As discussed in the previous section, aberrations are important characteristics of lenses and affect the overall performance of the optical system integrating the lenses. There are a few ways to measure the aberrations. First, if the geometric profiles of the lens and the materials of which the lens is made (refractive indices) are known, ray tracing can predict how the rays would be bent as they pass through the lens and thus calculate the aberrations. This essentially utilizes the definitions of the aberrations described above. To obtain a lens profile, mechanical profilometers [5,6] or white light interferometry [5,7] can be used. 

These devices are easily amenable to inspection of the complete fluidic path. The empty channel surface and the liquid surface of the Ailed channel were accessible by white light interferometry. Using n-butanol as liquid flowing in microchannels of 100 pm X 300 pm cross-section, a complete filling of the microchannels without any flooding or undesired wetting of liquid at the walls of the cylinder next to the channel was achieved. 

They used the same approach for the quantitative study of acid-induced dissolution of enamel. A UME was used to generate a flux of protons galvanostatically just above a sample surface. This produced etch features in the sample, which were characterized by white light interferometry. The technique has been applied to bovine enamel where understanding the kinetics of dissolution is important in the context of acid erosion. Dissolution has been observed as a fast process, but the high rates of mass transport in SECM allowed the surface kinetics of dissolution to be evaluated. 

The coverage of a polymer layer is given by the weight adsorbed per unit area, known also as the adsorbance, T. By using the SFB white light interferometry method, the variation in the refractive index can be measured as a function of the separation distance, from which T can be derived. ... 

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