Wave intensity distribution

Figure 7.21 illustrates a particular case where the maximum of the v = 4 wave function near to the classical turning point is vertically above that of the v" = 0 wave function. The maximum contribution to the vibrational overlap integral is indicated by the solid line, but appreciable contributions extend to values of r within the dashed lines. Clearly, overlap integrals for A close to four are also appreciable and give an intensity distribution in the v" = 0 progression like that in Figure 7.22(b). 

Pt2,V and Pt y have been investigated at 1393 K and 1224 K respectively and we have explored the [100] and [110] planes of the reciprocal lattice. The measured Intensities have been Interpreted in a Sparks and Borie approach with first order displacements parameters and using a model Including 29 a(/ ) for PfsV and 21 for PtsV. In figure 1 is displayed the intensity distribution due to SRO a q) in the [100] plane. As for PdjV, the diffuse intensity of Pt V is spread along the (100) axes with maxima at the (100) positions, whereas the ground state is built on (1 j 0) concentration wave ( >022 phase). 

Figure 7 shows an aberration-free intensity distribution at the focus of a typical objective lens similar to that used for DLW lithography. Calculations were carried out using a vectorial Debye theory, which accounts for the polarization effects. For the linearly polarized wave it can be seen that the spot is elongated along the polarization vector. To reduce this asymmetry, a X/4-plate can be used to convert the polarization of the incident beam to circular, which can be interpreted as a combination of two mutually perpendicular linearly polarized components. Thus, width of the photomodified line becomes independent of the beam scanning direction in the sample. 

Fig. 7 Plane wave focusing by a NA = 1.35 objective lens, calculated using vectorial Debye theory, a The normalized 3D intensity distribution with the cutoff threshold at 1% intensity. The lateral cross-sections are plotted on a log-scale at the axial positions z = 0 (b) and z = 7-/2 (c), respectively. Contour lines are plotted at 0.5 (inner) and 1/e (outer) levels, respectively. Polarization of the plane wave was horizontal (along x)...

Fig. 11 2D model structure of empty channels inside a material with refractive index, n = 1.5. The refractive index distribution (a) and the corresponding near-field pattern of light intensity distribution was calculated by the FDTD technique. The arrow marks the direction of the plane wave (0,1,0) incidence, d is thickness of the sample. The square in b marks the region of the TFSF source used in the calculations... 

Figure 12 shows intensity distribution of different electric field components on the plane touching the back-side of the nanosphere. Strong depolarization is clearly seen, as the incident wave is polarized along the y-axis. 

Fig. 12 Optical near-field intensity distribution at the siuface of spherical gold nanoparticle with radius of 50 nm, calculated by FDTD technique. The incident field (1,0,0) was polarized along the y-axis the field monitor plane is perpendicular to the wave propagation direction (z-axis) and located at a distance of 70 nm from the center of the sphere...

Fig. 4.2. The field in a solid due to focused acoustic waves incident on the surface. The lens semi-angle in the fluid was 10°, the ratio of acoustic velocities in the fluid and in the solid was 0.25, and the paraxial focus was at a depth of 20 wavelengths in the solid, (a) Intensity distribution along the axis (b) lateral intensity distribution in the focal plane. (Courtesy of Bruce Thompson.)...

Let us consider the possibility of reflection of electrons by an evanescent laser wave formed due to total internal reflection of femtosecond laser pulses from a dielectric-vacuum interface [4] (Fig. lb). Such a laser field was considered elsewhere [7, 8] to effect the mirror reflection of atoms (references to the latest works on the mirror reflection of atoms can be found in Refs. 9 and 10). The light intensity distribution in the evanescent wave in the vacuum may be represented in the form [11]... 

The power-dependent refractive index change is obtained by taking a suitable average of the nonlinearity over the intensity distribution associated with the guided wave. The propagation wavevector can be written as... 

Fig. 26. LEED intensity distributions over a 4 x 7-mm2 Pt(IOO) sample from spots characterizing the CO c2 x 2 structure (left) and the hex structure (right) during kinetic oscillations, illustrating the propagation of waves of structural transformations across the surface. (From Ref. JO.)...

For any particular particle leaving the source S and ultimately striking the detection screen D, the value of

interaction with the detector at slit A. However, this value is not known and cannot be controlled for all practical purposes it is a randomly determined and unverifiable number. The value of

pattern observed on the screen is the result of a large number of impacts of particles, each with wave function xV(x) in equation (1.50), but with random values for probability density P,p(x) is just the sum of PA(x) and PB(x), giving the intensity distribution shown in Figure 1.9(b). 

Figure 8.17 (a) Optical field of light in waveguide and (b) Intensity distribution of the evanescent wave on the waveguide. 

It was found that the surface of the photosensitive film was modulated by the intensity distribution of light induced by the fine structures of the specimen. The cilia of a paramecium were clearly observed. One could recognize that the end of each cilium branched into two cilia. Because the spatial resolution of the observed result is smaller than 100 nm, the evanescent wave distribution generated by the fine structures of the specimens were imaged with the near-field recording technique. 

The simplest theory of diffraction [11, 16] relates the intensity distribution of the X-ray wave scattered on a perfect crystal to the distribution of the electrons in the unit cell of volume Vc ... 

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