Vertical scans

Icenhower, J. P., Luttge, A. et al. 2003. Results of vertical scanning interferometry (VSI) of dissolved borosilicate glass Evidence for variable surface features and global surface retreat. Materials... 

VLNW VNCR voc VS1 Very low-activity nuclear waste Valence coordination number ratio Volatile organic compound Vertical scanning interferometry... 

Balloon-borne tether systems for repeated vertical scans obtained from a single balloon launch... 

Fig. 12. Rendering of the Reel Down platform with associated suspended payload. This system is capable of vertical scans of greater than 10 km from a balloon floating at or below 40 km.

A slit-like nanospace can be made up by applying so-called the colloidal probe AFM technique, which was in its origin developed to measure the force between a solid surface and a particle of micrometer size. The particle was glued on the cantilever tip, and this colloidal probe is to be used instead of the usual cantilever. The vertical scanning of the cantilever controls the distance between the particle surface and a solid surface, and the usual manner of detecting the bending of cantilever gives the... 

Implanters utilizing a fast-scanned beam with a one-dimensional mechanical scan can be further divided into a vertical scan and a plane-of-wafer scan, see Fig. 15.16. In the former, the mechanical scan direction is always perpendicular to the ion beam vector. In the latter, the mechanical scan direction is adjusted with the wafer tilt, so that it is always in the plane of the wafer. It is clear that, for the case of a zero-degree implant, the two methods are identical. However, for tilted implants, the vertical scan method results in the beam travel distance (and hence the beam size in the case of highly divergent beams) becoming a function of vertical position on the wafer. The degree of across-wafer variation increases with the... 

Fig. 15.16. A comparison of two different types of endstation motion, (a) A vertical scan (perpendicular to the beam) can result in different beam spot sizes on opposite edges of the wafer (the numbers here are for a 300 mm wafer) and (b) a plane-of-wafer (constant focal length) scan which exposes all points to the same size beam...

The various regimes with their crossover lines are shown schematically in Eig. 15. Keeping the charge fraction / constant while changing the amount of salt corresponds to a vertical scan through the... 

An electrode organization with the two well unit cell as shown in Fig. 6.13 allows horizontal and vertical scan registers external to the CID chip to read out the unit cells. Thus an m x CID array would require m -l- n connections to the IR sensitive material. Since the CID is xy addressed, random access to any... 

The standards adopted by the Federal Communications Commission (FCC) for monochrome television in the U.S. specified a system of 525 lines per frame, transmitted at a frame rate of 30 Hz, with each frame composed of two interlaced fields of horizontal Hnes. Initially in the development of television transmission standards, the 60-Hz power Hne waveform was chosen as a convenient reference for vertical scan. Furthermore, in the event of coupling of power Hne hum into the video signal or scanning/deflection circuits, the visible effects would be stationary and less objectionable than moving hum bars or distortion of horizontal-scanning geometry. In the United Kingdom and much of Europe, the 50-Hz interlaced system was chosen for many of the same reasons. With improvements in television receivers, the power Hne reference was replaced with a stable crystal oscillator. 

Fig. 10.35. Fluorescence spectra from a vertical scan of the facade of Lund Cathedral, Sweden, The measurement distance was about 60 m [10.131]...

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