Use of scanning electron microscope

The morphology of the surface of the polysulfone PSU and the composites PSU/Ag was examined with the use of scanning electron microscope (SEM) Jeol JSM 5400, with a unit for the chemical analysis in micro-areas EDS (Link ISIS series 300) in the secondary electron detection system (SE). 

The reduced pellets are identified by X-ray diffraction (XRD CuK n radiation) at various experimental stages for the different temperatures, and the microscopic morphology and composition distribution of the products are observed and analyzed by use of scanning electron microscope (SEM). 

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