Transmission electron microscopy conventional imaging

Transmission electron microscopy (TEM) is a powerful and mature microstructural characterization technique. The principles and applications of TEM have been described in many books [16 20]. The image formation in TEM is similar to that in optical microscopy, but the resolution of TEM is far superior to that of an optical microscope due to the enormous differences in the wavelengths of the sources used in these two microscopes. Today, most TEMs can be routinely operated at a resolution better than 0.2 nm, which provides the desired microstructural information about ultrathin layers and their interfaces in OLEDs. Electron beams can be focused to nanometer size, so nanochemical analysis of materials can be performed [21]. These unique abilities to provide structural and chemical information down to atomic-nanometer dimensions make it an indispensable technique in OLED development. However, TEM specimens need to be very thin to make them transparent to electrons. This is one of the most formidable obstacles in using TEM in this field. Current versions of OLEDs are composed of hard glass substrates, soft organic materials, and metal layers. Conventional TEM sample preparation techniques are no longer suitable for these samples [22-24], Recently, these difficulties have been overcome by using the advanced dual beam (DB) microscopy technique, which will be discussed later. 

Transmission electron microscopy (TEM) is probably the most powerful technique for obtaining structural information of supported nanoparticles [115-118], Complementary methods are STM, AFM, and SEM. Both the latter and TEM analysis provide more or less detailed size, shape, and morphology information, i.e., imaging in real space. TEM has the great additional advantage to provide information in Fourier transform space, i.e., diffraction information, which can be transformed to crystal structure information. From a practical point of view, considering the kinds of planar model catalysts discussed above, STM, AFM, and SEM are more easily applied for analysis than TEM, since the former three can be applied without additional sample preparation, once the model catalyst is made. In contrast, TEM usually requires one or more additional preparation steps. In this section, we concentrate on recent developments of microfabrication methods to prepare flat TEM membrane supports, or windows, by lithographic methods, which eliminate the requirement of postfabrication preparation of model catalysts for TEM analysis. For a more comprehensive treatment of other, more conventional, procedures to make flat TEM supports, and also similar microfabrication procedures as described here, we refer to previous reviews [118-120]. 

Veblen, D.R., 1990. Transmission electron microscopy Scattering processes, conventional microscopy, and high-resolution imaging, in I.D.R. Mackinnon and EA. Mumpton, eds, Electron and Optical Methods in Clay Science, The Clay Minerals Society, CMS Workshop Lectures, 2, pp. 15 10. 

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