Three-dimensional atomic force microscopy image

Figure 8.2 Three-dimensional atomic force microscopy images of the surface of (a) uncoated, (b) single-layered, (c) double-layered, and (d) triple-layered coated samples, (e) roughness values of the deposited Hlms. ...

Figure 10. Three-dimensional AFM images of (a) Pt/polished AI2O3, (b) Pt/etched Ni, and (c) Pt/unpolished AI2O3 electrodes. Reprinted from J. -Y. Go et al., A study on ionic diffusion towards self-affine fractal electrode by cyclic voltammetry and atomic force microscopy, J. Electroanal. Chem., 549, p. 49, Copyright 2003, with permission from Elsevier Science.

Fig. 116a. Three-dimensional side view of a PbSe particulate film imaged on a 470 nm x 470 nm section by atomic force microscopy (AFM). b Profile of the PbSe crystals by AFM sectioning. The vertical tine in the image shows the position of the sectioning [648]...

Figure 4.7 Three-dimensional image of a gamma-alumina membrane by atomic force microscopy [Bottinoeial., 1994]...

Atomic force microscopy (AFM) and scanning tunneling microscopy (STM) offer a means of obtaining three-dimensional images of polymer surfaces. These techniques... 

Atomic Force Microscopy (AFM) Analysis Results. The best MDF cements from mechanical point of view, in two series of MDF cements were submitted to AFM analysis. Figs. 5 to 8 show AFM three-dimensional images of the B3 and BAl surfaces in dry and water-stored state, respectively. 

The atomic force microscopy technique is now widely used for the study of membrane surfaces. It has become an important tool of imaging the surface of materials to atomic-level resolution, and this technique does not need any special sample preparation, which is essential for SEM and TEM. AEM can show three-dimensional images of the surfaces. Paredes et al. has written an excellent review on the application of AEM for the characterization of microporous and mesoporous materials [16]. 

Atomic force microscopy (AFM) images of the unmodified membrane NFPESIO and all of the surface-modified membranes were taken in an air environment at room tanperature and at different locations across each membrane sample. Figures 5.23 and 5.24 show examples of the three-dimensional AFM images obtained. 

An atomic force microscope uses the deflection produced in a fine tip by interactions with atoms in the surface of a membrane to reconstruct the surface structure of that membrane. A piezoelectric drive moves the sample surface under the tip. The motions of the tip are converted into a three-dimensional image of the surface. Atomic force microscopy requires no surface preparation so that the membrane can be observed in its normal environment. 

Figure 15.5 shows images obtained directly over the surface of the samples and their respective three-dimensional projection by the technique of atomic force microscopy to vulcanized NR and the magnetic nanocomposite formed by the addition of 5, 20 and magnetic loading 50 phr in a matrix of vulcanized NR. 

Figure 4.4 Surface roughness characterization using atomic force microscopy of the recycled silicone rubber samples (a) two-dimensional image of microstructure, scanning in transverse section, section penetration level of 5 pm (b) three-dimensional image of microstructure, scanning in transverse section, section penetration level of 5 pm (c) two-dimensional image of microstructure, scanning in hansverse section, penetration level section of 25 pm and (d) three-dimensional image of microstructure, scanning in transverse section, section penehation level of 25 pm.

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