Thin films preparation technique comparison

Ileperuma, O.A., et al., Comparison of CdS thin films prepared by different techniques for applications in solar cells as window materials. J. Mater. Set. Mater. Electron., 1998. 9 p. 367-372. 

M = Tb, Lu) into organic thin-film transistors by LB technique and reported their field effect mobility, which represented the first report for p-type OFETs based on bis(phthalocyaninato) rare earth complexes prepared via LB method [88], Due to the highly ordered molecular arrangement of M(Pc)[Pc(OC8Hi7)g] (M = Tb, Lu) in LB films and the appropriate HOMO energy level of these double-deckers relative to the Au source-drain electrodes, the OFETs reported in that work exhibited higher hole transfer mobility of 1.7 x 10-3 cm2 V-1 s-1 in comparison with those fabricated from monomeric phthalocyanine LB films. 

Ceramic and semiconductor thin films have been prepared by a number of methods including chemical vapor deposition (CVD), spray-coating, and sol-gel techniques. In the present work, the sol-gel method was chosen to prepare uniform, thin films of titanium oxides on palladium Titanium oxide was chosen because of its versatility as a support material and also because the sol-gel synthesis of titania films has been clearly described by Takahashi and co-workers (22). The procedure utilized herein follows the work of Takahashi, but is modified to take advantage of the hydrogen permeability of the palladium substrate. Our objective was to develop a reliable procedure for the fabrication of thin titania films on palladium, and then to evaluate the performance of the resulting metalloceramic membranes for hydrogen transport and ethylene hydrogenation for comparison to the pure palladium membrane results. 

Interelement effects are small or negligible in thin-film samples, because neither the primary nor the secondary x-rays are strongly absorbed. Thus, the intensities of the secondary x-rays are directly proportional to the amount of the element present matrix effects are minimized by this technique. Because standards and unknowns are prepared in a similar manner, linear comparison of intensities is valid. 

In this paper we consider the influence of composition and structure on the optical and electric characteristics of SnOx thin films deposited on glass substrates by sol-gel technique. For comparison, the data for films prepared by magnetron sputtering, are presented. Using various techniques the effect of both thermal and plasma treatments on the structure and properties of the SnOx films were studied. 

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