Thermal analyzer, schematic diagram

Figure 11.3 Schematic Diagram of a Differential Thermal Analyzer. (Source E.I. Du Pont De Nemours, Inc, USA)...

FIGURE 11.67 Schematic diagram of one type of thermal analyzer for organic and graphite carbon (adapted from Huntzicker et al., 1982). 

Figure 4.43a shows the block diagram of the dielectric differential thermal analyzer, where the dielectric sensor circuit and the capacitors formed by the sample and reference (Cr) and specimen holders (Cx) are schematically represented, and a photo of the home-made equipment is shown in Figure 4.43b [89,109,110],... 

Figure 9.26. Schematic diagram of depolarized light intensity apparatus (74). A. unitron MPS microscope B. analyzer sheet C. polarizer sheet D. movable abbe condenser E. tungsten lamp F. movable hot stage G. heater H. program thermocouple 1. sample temperature thermocouple J. sample well K. pin plug terminal attached to microscope stand L. shielded cable to Du Pont module M. photocell N, movable mirror O. ocular P. Du Pont 900 differential thermal analyzer module Q. programmer R. X-Y recorder.

Schematic Diagram of the Simultaneous Thermal Analyzer STA 409EP (Netzsch Geratebau GmbH)...

FIGURE 21.11 Schematic diagram of a gas chromatography (GC) analyzer. The gas mixture to be analyzed is drawn through the column where it is separated into its constituent species. The separated gases are then drawn through another gas detector (often a thermal conductivity analzyer), where concentrations are measured. 

The DTA/DSC-EGD coupled simultaneous technique and relevant equipment have been investigated since 1979 [62, 74, 75]. The Model CDR-1 power compensation DSC analyzer (ambient temperature ca 720 C) was developed by the Tian Ping Instrumental Factory (Shanghai, China). The EGD detector is a thermal conductivity detector (TCD) in the GC analyzer. The CDR-1 DSC analyzer coupled with GC was constructed using a specially designed gas conduit. A schematic diagram of the on-line coupled simultaneous DTA/DSC-EGD apparatus is shown in Figure 2.33. 

Figure 8.6 Schematic diagrams for the ICP/SIFT (top) and Elan 6100DRC (bottom) instruments. In the ICP/SIFT instrument ions are produced in a plasma source and sampled by a standard atmosphere-vacuum interface (see text). The ion of interest is mass-selected in Q1, after which it is passed to the flow tube via a Venturi inlet. The flow tube is kept at a constant pressure of 0.35 Torr. Thermalized ions react with a neutral admitted at the reagent inlet as they flow downstream (to the right). Product ions are mass analyzed by Q2. In the Elan 6100DRC, ions are produced and sampled as above but are then reacted in a bandpass quadrupole reaction cell (DRC). Unreacted ions and product ions are detected by the mass analyzer quadrupole.

Fig. IJS Schematic diagram of a thermal gravimetric analyzer (TGA) system for the reactivity test 1 water reservoir and bubbler, 2 gas pre-heater, 3 electric balance, 4 sample basket, 5 heater, 6 personal computer (from Ref. [29])...

Dynamic mechanical analyzers can be divided into resonant and d ined frequency instruments. The torsion pendulum just described is, for example, a resonant instrument The schematic of a defined-frequency instrument is shown at the bottom of Fig. 6.18. The basic elements are the force generator and the strain meter. Signals of both are collected by the module CPU (central processing unit) and transmitted to the computer for data evaluation. This diagram is drawn after a modern, commercial DMA produced by Seiko. For the address of this company see Ref. 18 of Chapter 5. Several of the other thermal analysis manufacturers also produce DMA equipment (for example Du Pont, PL Thermal Sciences, Netzsch, and more recently also Perkin-Elmer). 

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