Spectrometers electron ionization mass

Electron Ionization Mass Spectrometers for Stable Isotope Ratio Measurements... 

Ions formed in an electron ionization mass spectrometer possess a relatively low initial energy spread, therefore single focnsing magnetic sector field instruments are sufficient to separate ion beams with different m/z ratios. Commercial stable isotope ratio mass spectrometers (SIRMS) allow highly precise and accnrate isotope ratio measnrements e.g., with the Finnigan MAT 253, of H/D, C/ C, N/ N, 0/ 0, jQj and SFg) Si/ Si as weU as Ar, Kr and... 

We describe below the rotating-beam-source-photofragmentation apparatus [70] of the Wilson design used in our laboratory (see Fig. 1). The apparatus can be divided into three main components an excimer excitation laser, a photodissociation chamber in which a rotatable supersonic molecular beam intersects the laser beam, and a linearly movable, ultrahigh vacuum-electron ionization mass spectrometer detector. 

Schematic diagram of an electron ionization mass spectrometer (EI-MS).

A connnon feature of all mass spectrometers is the need to generate ions. Over the years a variety of ion sources have been developed. The physical chemistry and chemical physics communities have generally worked on gaseous and/or relatively volatile samples and thus have relied extensively on the two traditional ionization methods, electron ionization (El) and photoionization (PI). Other ionization sources, developed principally for analytical work, have recently started to be used in physical chemistry research. These include fast-atom bombardment (FAB), matrix-assisted laser desorption ionization (MALDI) and electrospray ionization (ES). 

This chapter should be read in conjunction with Chapter 3, Electron Ionization. In electron ionization (El), a high vacuum (low pressure), typically 10 mbar, is maintained in the ion source so that any molecular ions (M +) formed initially from the interaction of an electron beam and molecules (M) do not collide with any other molecules before being expelled from the ion source into the mass spectrometer analyzer (see Chapters 24 through 27, which deal with ion optics). 

Much of the energy deposited in a sample by a laser pulse or beam ablates as neutral material and not ions. Ordinarily, the neutral substances are simply pumped away, and the ions are analyzed by the mass spectrometer. To increase the number of ions formed, there is often a second ion source to produce ions from the neutral materials, thereby enhancing the total ion yield. This secondary or additional mode of ionization can be effected by electrons (electron ionization, El), reagent gases (chemical ionization. Cl), a plasma torch, or even a second laser pulse. The additional ionization is often organized as a pulse (electrons, reagent gas, or laser) that follows very shortly after the... 

A major advantage of the TOF mass spectrometer is its fast response time and its applicability to ionization methods that produce ions in pulses. As discussed earlier, because all ions follow the same path, all ions need to leave the ion source at the same time if there is to be no overlap between m/z values at the detector. In turn, if ions are produced continuously as in a typical electron ionization source, then samples of these ions must be utihzed in pulses by switching the ion extraction field on and off very quickly (Figure 26.4). 

As described above, the mobile phase carrying mixture components along a gas chromatographic column is a gas, usually nitrogen or helium. This gas flows at or near atmospheric pressure at a rate generally about 0,5 to 3.0 ml/min and evenmally flows out of the end of the capillary column into the ion source of the mass spectrometer. The ion sources in GC/MS systems normally operate at about 10 mbar for electron ionization to about 10 mbar for chemical ionization. This large pressure... 

As each mixture component elutes and appears in the ion source, it is normally ionized either by an electron beam (see Chapter 3, Electron Ionization ) or by a reagent gas (see Chapter I, Chemical Ionization ), and the resulting ions are analyzed by the mass spectrometer to give a mass spectmm (Figure 36.4). 

It is worth noting that some of these methods are both an inlet system to the mass spectrometer and an ion source at the same time and are not used with conventional ion sources. Thus, with electrospray, the process of removing the liquid phase from the column eluant also produces ions of any emerging mixture components, and these are passed straight to the mass spectrometer analyzer no separate ion source is needed. The particle beam method is different in that the liquid phase is removed, and any residual mixture components are passed into a conventional ion source (often electron ionization). 

In a high vacuum (low pressure 10 mbar), molecules and electrons interact to form ions (electron ionization, El). These ions are usually injected into the mass spectrometer analyzer section. 

Mass Spectrometry. As of 1996, ms characteristics of pyrazoles and derivatives had not been described in depth. The fate of unsubstituted pyrazole (23) in the mass spectrometer operated in the electron ionization mode may be depicted as follows ... 

Laser ionization mass spectrometry or laser microprobing (LIMS) is a microanalyt-ical technique used to rapidly characterize the elemental and, sometimes, molecular composition of materials. It is based on the ability of short high-power laser pulses (-10 ns) to produce ions from solids. The ions formed in these brief pulses are analyzed using a time-of-flight mass spectrometer. The quasi-simultaneous collection of all ion masses allows the survey analysis of unknown materials. The main applications of LIMS are in failure analysis, where chemical differences between a contaminated sample and a control need to be rapidly assessed. The ability to focus the laser beam to a diameter of approximately 1 mm permits the application of this technique to the characterization of small features, for example, in integrated circuits. The LIMS detection limits for many elements are close to 10 at/cm, which makes this technique considerably more sensitive than other survey microan-alytical techniques, such as Auger Electron Spectroscopy (AES) or Electron Probe Microanalysis (EPMA). Additionally, LIMS can be used to analyze insulating sam-... 

Experimental. The mass spectra in Figures 1-8 are positive-ion spectra produced by electron impact and were obtained from a single-focusing, magnetic deflection Atlas CH4 Mass Spectrometer. The ionizing potential was 70 e.v. and the ionizing current 18/a a. An enamel reservoir heated to 120°C. was used from which the sample was leaked into the ion source. 

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