Big Chemical Encyclopedia

Chemical substances, components, reactions, process design ...

Articles Figures Tables About

Specimen preparation method polishing

The need to be able to thin complex microelectronic devices, and to select and thin specific regions within them has resulted in ever-more sophisticated specimen preparation methods involving precision ion polishing. This requirement culminated in the development of the focused ion beam (FIB) technique, which is able to slice out electron-transparent foils from any multilayer, multiphase material with extreme precision. Overwijk et al. (1993) have described such a technique for producing cross-section TEM specimens from (e.g.) integrated circuits. [Pg.149]

The optical microscope is used to study various fiber features, such as (1) size, (2) cross section (shape), (3) uniformity, (4) molecular orientation and (5) distribution of fillers. Specimen preparation methods include direct observation and sectioning. Fibers are embedded prior to sectioning by nucrotomy (Section 4.3) or polishing (Section 4.2) methods. Figure 5.1 contains optical... [Pg.175]

The method of adiabatic calorimetry for specific heat measurement has been described by Collings and Smith [ ]. In the previous experiments with alloys, ground and polished surfaces achieved good thermal contact with the heater/thermometer pedestal by means of a thin layer of silicone vacuum grease. For the composites, a different specimen preparation and mounting procedure was used. Each sample was made up of five slabs (about 2.5 cm x 2.5 cm x 0.3 cm) of material cemented together, fibers parallel, with methanol-diluted GE 7031 varnish. To maximize heat transfer, one face of the laminated sample was ground... [Pg.290]

Specimen polishing, for example, using successively finer grades of diamond paste, provides an alternative preparation method for surface examination. Filler particles may be subsequently etched, however, this can complicate interpretation of the image produced, since air voids contained in the structure may be indistinguishable from extracted filler. [Pg.236]

The most convenient and effective method for preparing a tip specimen is by electrochemical polishing of a piece of thin wire of 0.05-0.2 mm diameter. Usually the methods developed for electropolishing thin film specimens in transmission electron microscopes are also applicable for polishing field ion microscope tips.7 In Table 3.1 some of the commonly used emitter polishing solutions and conditions for the polishing are listed for various materials.8... [Pg.110]

In this method of study there are two important steps in the preparation of the specimen. The first is the growth of the single crystal itself, and the second is the preparation of the surface. Large single crystals of metals have been used for about fifty years largely for the study of physical and mechanical properties of metals, and it is only recently with the advent of electrolytic polishing that it has been possible to use them for the study of reactions between metals and gases. [Pg.66]

In summary, sample preparation is an essential part of microscopy and there are many techniques (and variations) that can be used. The approaches very commonly used to prepare specimens for analysis are as follows The sample needs to be cut to size using one of the slicing methods outlined. The cut sample is either set in a mold or mounted externally on a polishing mount. This step is followed by a series of coarser to finer grinding on SiC grit... [Pg.400]

Table II presents the results of some wettability measurements on adsorbed monolayers prepared from molten Compound D on pure, polished, clean, chromium surfaces after solvent treatment had been used to remove all surplus solidified acid. A series of successive solvent treatments was applied to each coated specimen (see first four columns of Table II) using liquids which have been shown to be good solvents for Compound in the bulk (9). These liquids were either absolute ethyl alcohol or benzene at or above 20°C., or n-hexane at or above 60°C. In the remaining columns are listed the average values of the slowly advancing contact angles measured by the drop-buildup method on from three to five different drops. Measurements were made on sessile drops of water, thiodiglycol, and methylene iodide. These three diagnostic liquids were chosen because of their high surface tensions (72.8, 54.0,... Table II presents the results of some wettability measurements on adsorbed monolayers prepared from molten Compound D on pure, polished, clean, chromium surfaces after solvent treatment had been used to remove all surplus solidified acid. A series of successive solvent treatments was applied to each coated specimen (see first four columns of Table II) using liquids which have been shown to be good solvents for Compound in the bulk (9). These liquids were either absolute ethyl alcohol or benzene at or above 20°C., or n-hexane at or above 60°C. In the remaining columns are listed the average values of the slowly advancing contact angles measured by the drop-buildup method on from three to five different drops. Measurements were made on sessile drops of water, thiodiglycol, and methylene iodide. These three diagnostic liquids were chosen because of their high surface tensions (72.8, 54.0,...
In literature the following methods of preparation of polymer material specimen and studying their morphology are described methods of ultrathin section and films with contrasting of osmium tetroxide (10.11). method of replication of the brittle fractur-ed surface (11.12) oxygen and chemical etch of the polished surface or the fractured surface with the following replication for electron microscopy (11. [Pg.379]


See other pages where Specimen preparation method polishing is mentioned: [Pg.158]    [Pg.142]    [Pg.194]    [Pg.251]    [Pg.74]    [Pg.31]    [Pg.265]    [Pg.10]    [Pg.3110]    [Pg.1]    [Pg.135]    [Pg.736]    [Pg.130]    [Pg.13]    [Pg.91]    [Pg.94]    [Pg.251]    [Pg.13]    [Pg.82]    [Pg.85]    [Pg.238]    [Pg.20]    [Pg.146]    [Pg.357]    [Pg.16]    [Pg.1079]    [Pg.7]    [Pg.107]    [Pg.344]    [Pg.114]    [Pg.540]    [Pg.63]    [Pg.89]    [Pg.130]    [Pg.78]    [Pg.50]    [Pg.12]    [Pg.428]    [Pg.87]    [Pg.144]    [Pg.12]    [Pg.274]   
See also in sourсe #XX -- [ Pg.142 , Pg.143 , Pg.144 , Pg.145 ]




SEARCH



Polish/polishers

Polisher

Polishes

Specimen preparation

Specimen preparation method

Specimen preparation method methods

Specimen preparation method polishing methods

Specimen preparation method polishing methods

© 2024 chempedia.info