Some Developments in Field Emission Techniques and their Application

Some Developments in Field Emission Techniques and their Application 

The field emission microscope (FEM) and the field ion microscope (FIM) are in many respects complementary instruments. While the FIM can depict surface structure in atomic detail, study of field electron emission from the same specimen can yield information about the electronic structure of the surface layer. Field ion microscopy has been the subject of an earlier review and in this article more recent developments in field emission microscopy and its application to surface studies are reviewed. Earlier developments have been the subject of several reviews. 

Muller, who died in 1977, invented the FEM in 1937, the FIM in 1956, and the atom probe in 1968. This unique achievement is a fitting memorial to a man who not only invented three major techniques for surface study but remained a principal contributor to surface science throughout his life. 

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