Size, diffraction

Most practical suspensions are polydisperse and generate a very complex diffraction pattern. The diffraction pattern of each particle size overlaps with diffraction patterns of other sizes, while the particles of different sizes diffract light at different angles and the energy distribution becomes a very complex pattern. However, the manufacturers of light-dif action instruments (such as Malvern, Coulters and Horriba) have developed numerical algorithms relating diffraction patterns to particle size distribution. 

M.G.Silk, The use of diffraction based time-of-flight measurements to locate and size defects , Br.J.Non-Destr. Test., 1984, 26(4), 208-213. 

We need to point out that, if the wavelengths of laser radiation are less than the size of typical structures on the optical element, the Fresnel model gives a satisfactory approximation for the diffraction of the wave on a flat optical element If we have to work with super-high resolution e-beam generators when the size of a typical structure on the element is less than the wavelengths, in principle, we need to use the Maxwell equations. Now, the calculation of direct problems of diffraction, using the Maxwell equations, are used only in cases when the element has special symmetry (for example circular symmetry). As a rule, the purpose of this calculation in this case is to define the boundary of the Fresnel model approximation. In common cases, the calculation of the diffraction using the Maxwell equation is an extremely complicated problem, even if we use a super computer. 

Shear Horizontal (SH) waves generated by Electromagnetic Acoustic Transducer (EMAT) have been used for sizing fatigue cracks and machined notches in steels by Time-of-Flight Diffraction (TOED) method. The used EMATs have been Phased Array-Probes and have been operated by State-of-the-art PC based phased array systems. Test and system parameters have been optimised to maximise defect detection and signal processing methods have been applied to improve accuracy in the transit time measurements. 

Due to the limitation posed by the initial electrical leakage signal and by the chosen angle of incidence of 52 deg. diffracted signals from 8 mm deep machined notch were hidden. Defects with depth exceeding 12 mm could be detected and sized. The same difficulty was observed when the thickness of the sample was less than 30 mm. 

The specific surface area of a solid is one of the first things that must be determined if any detailed physical chemical interpretation of its behavior as an adsorbent is to be possible. Such a determination can be made through adsorption studies themselves, and this aspect is taken up in the next chapter there are a number of other methods, however, that are summarized in the following material. Space does not permit a full discussion, and, in particular, the methods that really amount to a particle or pore size determination, such as optical and electron microscopy, x-ray or neutron diffraction, and permeability studies are largely omitted. 

We have considered briefly the important macroscopic description of a solid adsorbent, namely, its speciflc surface area, its possible fractal nature, and if porous, its pore size distribution. In addition, it is important to know as much as possible about the microscopic structure of the surface, and contemporary surface spectroscopic and diffraction techniques, discussed in Chapter VIII, provide a good deal of such information (see also Refs. 55 and 56 for short general reviews, and the monograph by Somoijai [57]). Scanning tunneling microscopy (STM) and atomic force microscopy (AFT) are now widely used to obtain the structure of surfaces and of adsorbed layers on a molecular scale (see Chapter VIII, Section XVIII-2B, and Ref. 58). On a less informative and more statistical basis are site energy distributions (Section XVII-14) there is also the somewhat laige-scale type of structure due to surface imperfections and dislocations (Section VII-4D and Fig. XVIII-14). 

Diffraction is the deflection of beams of radiation due to interference of waves that interact with objects whose size is of the same order of magnitude as the wavelengths. Molecules and solids typically have... 

It has been shown that spherical particles with a distribution of sizes produce diffraction patterns that are indistingiushable from those produced by triaxial ellipsoids. It is therefore possible to assume a shape and detemiine a size distribution, or to assume a size distribution and detemiine a shape, but not both simultaneously. 

Surface reconstructions have been observed by STM in many systems, and the teclmique has, indeed, been used to confmn the missing row structure in the 1 x 2 reconstruction of Au(l 10) [28]. As the temperature was increased within 10 K of the transition to the disordered 1 1 phase (700 K), a drastic reduction in domain size to -20-40 A (i.e. less than the coherence width of LEED) was observed. In this way, the STM has been used to help explain and extend many observations previously made by diffraction methods. 

It is relatively straightforward to detemiine the size and shape of the three- or two-dimensional unit cell of a periodic bulk or surface structure, respectively. This infonnation follows from the exit directions of diffracted beams relative to an incident beam, for a given crystal orientation measuring those exit angles detennines the unit cell quite easily. But no relative positions of atoms within the unit cell can be obtained in this maimer. To achieve that, one must measure intensities of diffracted beams and then computationally analyse those intensities in tenns of atomic positions. 

Diffraction is not limited to periodic structures [1]. Non-periodic imperfections such as defects or vibrations, as well as sample-size or domain effects, are inevitable in practice but do not cause much difSculty or can be taken into account when studying the ordered part of a structure. Some other forms of disorder can also be handled quite well in their own right, such as lattice-gas disorder in which a given site in the unit cell is randomly occupied with less than 100% probability. At surfaces, lattice-gas disorder is very connnon when atoms or molecules are adsorbed on a substrate. The local adsorption structure in the given site can be studied in detail. 

So it is essential to relate the LEED pattern to the surface structure itself As mentioned earlier, the diffraction pattern does not indicate relative atomic positions within the structural unit cell, but only the size and shape of that unit cell. However, since experiments are mostly perfonned on surfaces of materials with a known crystallographic bulk structure, it is often a good starting point to assume an ideally tenuinated bulk lattice the actual surface structure will often be related to that ideal structure in a simple maimer, e.g. tluough the creation of a superlattice that is directly related to the bulk lattice. 

Islands occur particularly with adsorbates that aggregate into two-dimensional assemblies on a substrate, leaving bare substrate patches exposed between these islands. Diffraction spots, especially fractional-order spots if the adsorbate fonns a superlattice within these islands, acquire a width that depends inversely on tire average island diameter. If the islands are systematically anisotropic in size, with a long dimension primarily in one surface direction, the diffraction spots are also anisotropic, with a small width in that direction. Knowing the island size and shape gives valuable infonnation regarding the mechanisms of phase transitions, which in turn pemiit one to leam about the adsorbate-adsorbate interactions. 

Because x-rays are particularly penetrating, they are very usefiil in probing solids, but are not as well suited for the analysis of surfaces. X-ray diffraction (XRD) methods are nevertheless used routinely in the characterization of powders and of supported catalysts to extract infomration about the degree of crystallinity and the nature and crystallographic phases of oxides, nitrides and carbides [, ]. Particle size and dispersion data are often acquired with XRD as well. 

Figure C2.17.9. Size-dependent changes in PXRD linewidtlis. PXRD can be used to evaluate tire average size of a sample. In tliese cases, different samples of nanocrystalline titania were analysed for tlieir grain size using tire Debye-Scherr fonnula. As tire domain size increases, tire widtlis of tire diffraction peaks decrease.

Kitakami O et al 997 Size effect on the crystal phase of cobalt fine particles Phys. Rev. B 56 13 849 Cullity B D 1978 Elements of X-ray Diffraction (Reading, MA Addison-Wesley)... 

---