Secondary ion mass spectrometr

J. J. Boon, K. Keune, J. van der Weerd, M. Geldof and J. de Boer, Imaging microspectroscopic, secondary ion mass spectrometric and electron microscopic studies on discoloured and partially discoloured smalt in cross sections of 16th century paintings, Chimia, 55, 952 960 (2001). 

Kosevich, M.V. Czira, G. Boryak, O.A. Shelkovsky, V.S. Vekey, K. Temperature Dependences of Ion Currents of Alcohol Clusters Under Low-Temperature Secondary Ion Mass Spectrometric Conditions. J. Mass Spectrom. 1998, 33, 843-849. 

Improvements in solid mass spectrometry after the Second World War focused on the development of several types of ion source and mass analyzers. For example, the fundamentals of secondary ion mass spectrometry had already been described by the observation of secondary ions by Thomson in 1910 5 T had the occasion.. . to investigate the secondary Canalstrahlen produced when primary Canalstrahlen strike against a metal plate. Significantly later in 1949, the first instrumental arrangement for secondary ion mass spectrometric measurements was reported by Herzog and Viehbock.43 The idea of applying secondary ions for surface analysis was developed in 1950 at the RCA Laboratories, Princeton, where Honig44 presented results of early SIMS studies. 

Fast Atom Bombardment Secondary Ion Mass Spectrometric Surface Analysis... 

Yoo HI, Wuensch BJ, Petuskey WT (1985) Secondary ion mass spectrometric analysis of oxygen self-diffusion in single-crystal MgO. Adv Ceram Stractuial Prop 10 394-405 Young ED, Rumble D (1993) The origin of correlated variations in in situ 0/ 0 and elemental concentrations in metamorphic garnet from sontheastem Vermont, USA. Geochim Cosmochim Acta... 

Piwowar, A.M., GardeUa, J.A. Jr. (2007) Time-of-flight secondary ion mass spectrometric analysis of polymer tertiary structure in Langmuir monolayer films of Poly(dimethylsiloxane). Anal. Chem., 79,4126 134. 

Metson, J.B., Tui, D.L., Muir, I.J., Bancroft, G.M. (1988) High energy secondaries for the quantitative secondary ion mass spectrometric analysis of minerals. Scanning Microsc., 2, 663-670. 

Yurimoto, H., and E. Ohtani, Element partitioning between major te and liquid a secondary ion mass spectrometric study, Geophys. Res. Utt., 19, 17-20, 1992. 

Leta DP, Morrison GH (1980) Ion implanted standards for secondary ion mass spectrometric determination of the Group lA-VIIA elements in semiconducting matrixes. Anal Chem 52 514-519. doi 10.1021/ac50053a032... 

Machida M., Eguchi K., Arai H. Effect of structural modification on the catalytic property of Mn-substituted hexaaliminate. J. Catal. 1990 123 477 85 Machida M., Shiomitsu T, Eguchi K., Haneda A., Arai H. secondary-ion mass spectrometric analysis of anisotoropic oxygen self-diffusion in barium hexaaluminate single crystals. J. Mate. Chem. 1992 2 455-458... 

Linton, R.W. Mawn, M.P. Belu, A.M. DeSimone, J.M. Hunt, M.O., Jr. Menceloglu, Y.Z. Cramer, H.G. Benninghoven, A. Time-of-FUght Secondary Ion Mass Spectrometric Analysis of Polymer Surfaces and Additives. Surf. Interface Anal. 1993, 20,991-999. 

Static secondary ion mass spectrometric techniques Thermal conductivity Thermogravimetric analysis Tetrahydrofuran... 

At present only one standard is under development. Determination of Boron Content in Silicon—Secondary Ion Mass Spectrometric Method. However, three other new standards may be started in the near future, namely... 

Secondary ion mass spectrometric analysis of cobalt-hardened gold electroplate surfaces, R. Schubert, J. Electwchem. Soc., 1981,128, 126. 

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