Scattering from surface roughness

F.G. Bass and I.M. Fuks, Wave Scattering from Statistically Rough Surfaces (Pergamon, Oxford 1979). 

Instrumentation. The experimental setup is similar to the one used in SPR. An additional photomultiplier mounted at fixed angle with respect to the base of the prism at the solution side of the electrode films is used to detect light scattered from the rough electrode surface and/or the polymer film deposited on the metal film (see Fig. 5.153). 

Ogilvy JA (1991) Theory of wave scattering from random rough surfaces. Adam Hilger, Bristol Siegel R, Howell JR (1972) Thermal radiation heat transfer. Me Graw-Hill, New York... 

J.A. Ogilvy, Theory of Wave Scattering from Random Rough Surfaces, Adam Hilger, Bristol, 1991. 

Tian Z.Q., Ren B., Wu D.Y., Surface-enhanced Raman scattering From noble to transition metals and from rough surfaces to ordered nanostructures, J. Phys. Chem. B 2002 106 9463-9483. 

Depending on the conditions, the constant 0.15 varied from to Figure 5 presents surface roughness values for a variety of land use categories compiled primarily from the reviews of Myrup and Ranzieri (1976) and Hodgin (1980) and presented by McRae et al. (1982). The precision implied by some entries on the figure is deceptive because there is considerable scatter in many of the underlying experimental data. 

The primary objective of preprocessing treatments is to remove the nonchemical biases from the spectral information. Scattering effects induced by particle size or surface roughness may lead to offsets or other more complex baseline distortions. Differences in sample density or the angle of presentation may induce overall intensity variations as well as additional baseline distortions. Most samples are not perfectly uniform on the microscopic scale, and these effects may dominate the initial contrast observed in an un-processed chemical image. In some cases this contrast may provide useful information to the analyst however, it is generally removed in order to focus on the chemical information. 

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