Scanning probe microscopy University

Wiesendanger R 1994 Scanning Probe Microscopy and Spectroscopy Methods and Appiications (New York Cambridge University Press)... 

Scanning probe microscopy is a forefront technology that is well established for research in surface physics. STM and SFM are now emerging ftom university laboratories and gaining acceptance in several industrial markets. For topographic analysis and profilometry, the resolution and three-dimensional nature of the data is... 

Wiesendanger, R. (1994) Scanning Probe Microscopy and Spectroscopy, Cambridge University Press, Cambridge. 

Mark A. Barteau is Robert L. Pigford Professor and Chair of the Department of Chemical Engineering at the University of Delaware. He received his B.S. degree from Washington University in 1976 and his M.S. (1977) and Ph.D. (1981) from Stanford University. His research area is chemical engineering with specialized interests in application of surface techniques to reactions on nonmetals, hydrocarbon and oxygenate chemistry on metals and metal oxides, scanning probe microscopies, and catalysis by metal oxides. 

B.D. Ratner and V.V. Tsukruk, Eds., Scanning Probe Microscopy, Oxford University Press, New York, 1998. 

Appelo CAJ, Postuma D (1993) Geochemistry, groundwater and pollution. Balkema, Rotterdam. Atkins P, de Paula J (2002) Physical chemistry, 7th edn. Oxford University Press, Oxford Bailey GW, AMm LG, Shevcenko SM (2001) Predicting chemical reactivity of humic substances for minerals and xenobiotics Use of computational chemistry, scanning probe microscopy and virtual reality. In Clapp CE et al.. Humic substances and chemical contaminants. Soil Science Society of America, Madison, WI, pp 40-72... 

Figure 22. The tunneling current, I, measured between two metal electrodes (tungsten en platinum) separated by a vacuum barrier as a function of the difference in electrochemical potential (here denoted as C/emitter-anode) the distance between the two electrodes (12, 20, 17 A) is indicated in the figure. Reprinted from Scanning Probe Microscopy and Spectroscopy , R. Wiesendanger, Cambridge University Press 1994...

Figure 5.4 An STM image of a 32 nm x 36 nm area on the Si (111) planes. Surface atoms have been reconstructed, showing 7x7 symmetry. Three atomic steps separate terraces. (Reproduced with permission from R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy, Cambridge University Press, Cambridge, UK. 1994 Cambridge University Press.)...

R. Wiesendanger, Scanning probe microscopy and spectroscopy methods and application, Cambridge University Press. Camridge, UK, 1994. 

R Wiesendanger. Scanning Probe Microscopy and Spectroscopy—Methods and Applications. Cambridge Cambridge University Press, 1994, pp 525-534. 

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