Scanning probe microscopy schematic

Figure 1.5 Schematic depiction of traditional hght microscopy, transmission electron microscopy, scanning electron microscopy, and scanning probe microscopy.

Tools are required to characterize these structures, and the most widely used methods rely on various scanning probe microscopy techniques. All of these techniques rely on the use of a specialized "tip" that is brought into proximity to the surface to be visualized. As schematically shown below, the tip moves around the surface and maps out macroscopic features or electronic properties of the surface using a variety of techniques. In the scheme shown, the tip encounters a raised rectangle and moves over it. Rastoring the tip back and forth over the surface maps out the full length of the rectangle. Several techniques of this type have been developed, but we only describe four here. 

Scanning Probe Microscopy, Rguro 4 Schematic of a generaiised Scanning Probe Microscope... 

Scanning Probe Microscopy. The scanning probe microscope (SPM) is a commercially available instrument (Nanoscope III, from Digital Instruments) that offers a relatively new means to distinguish continuous conductive pathways in disordered carbon-black-polymer composites. Figure 2 is a schematic illustration of how the SPM can be used to image carbon-black-polymer composites. 

FIGURE 2.3.12 (a) Schematic diagram of experimental setup for scanning Kelvin probe microscopy (SKPM). (b) Profiles of an L = 5.5 J,m P3HT transistor with Cr electrodes taken at three different temperatures V = 0 V, = -8 V). The inset shows a profile obtained after switching the source and drain contacts on the same TFT with both Cr and Cr-Au contacts Vg = 0 V, = -8 V). (From Burgi, L. et ah, J. Appl. Phys., 94, 6129-6137, 2003. Reprinted with permission. Copyright 2003, American Institute of Physics.)... 

Fig. 2.5 Schematic set-up of scanning force microscopy and modes of operation variation in surface properties are detected via the deflection of the cantilever with probing tip...

Figure 11.14 Schematic of a (a) thermocouple tip and (b) passive thermoresistive probe used with a AFM tip for scanning thermal microscopy...

Figure 7.12. Schematic for scanning tunneiing opticai microscopy configuration. 1, detector 2, optical probe 3, sample 4, substrate.

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