Scanning probe microscopy methods

Durig U, Zuger O and Staider A 1992 interaction force detection in scanning probe microscopy methods and appiications J. Appl. Phys. 72 1778... 

A common problem in all scanning probe microscopy methods is that tips have some width (in the best case they are still at least one atom wide) and that the width of the tip leads to broadening of the structures observed on the surface by convolution of the tip with the surface. This is explained in more details in the Tutorial on STM tips. 

A number of methods that provide information about the structure of a solid surface, its composition, and the oxidation states present have come into use. The recent explosion of activity in scanning probe microscopy has resulted in investigation of a wide variety of surface structures under a range of conditions. In addition, spectroscopic interrogation of the solid-high-vacuum interface elucidates structure and other atomic processes. 

Wiesendanger R 1994 Scanning Probe Microscopy and Spectroscopy Methods and Appiications (New York Cambridge University Press)... 

Since the introduction of scanning tunnelling microscopy, a family of scanning probe microscopies (SPMs) have been developed (Table 3.1), with three main branches resulting from three different types of probe. All of the methods have in common the ability to image surfaces in real space at nanometre or better resolution, are straightforward to implement and are relatively low in cost. 

The already critical need for molecular-scale compositional mapping will increase as more complex structures are assembled. Currently, electron microscopy, scanning probe microscopy (SPM) and fluorescence resonance energy transfer (FRET) are the only methods that routinely provide nanometer resolution. 

C. J. Chen, Introduction to Scanning Tunneling Microscopy, Oxford University Press, New York, 1993 R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy Methods and Applications, Cambridge University Press (1994). 

For direct patterning on the nanometer scale, scanning probe microscopy (SPM) based techniques such as dip-pen-nanolithography (DPN), [112-114] nanograftingf, nanoshaving or scanning tunneling microscopy (STM) based techniques such as electron induced diffusion or evaporation have recently been developed (Fig. 9.14) [115, 116]. The SPM based methods, allows the deposition of as-sembhes into restricted areas with 15 nm linewidths and 5 nm spatial resolution. Current capabihties and future applications of DPN are discussed in Ref. [117]. 

Around 1980 a new method of microscopy known as scanning probe microscopy (SPM) was invented. Within the past ten years, applications have been increasing exponentially in fields like surface physics and chemistry, biology and optics. SPM is also beginning to emerge as a usefvil and popular technique for R D and quality control in several industries. 

Pb UPD on Ag(lll) and Ag(lOO) has been studied using X-ray diffraction method, electrochemical impedance spectroscopy, and in situ scanning probe microscopy [272, 286-288]. This process has been reviewed in [265, 270], see Table 2. Both structure and voltammetric behavior are dependent on the Ag(h, k, 1) plane [265, 289]. 

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