Scanning probe microscope SPM

STM and SFM belong to an expanding family of instruments commonly termed Scanning Probe Microscopes (SPMs). Other common members include the magnetic force microscope, the scanning capacitance microscope, and the scanning acoustic microscope. ... 

FIGURE 9.14 Typical approach force curve (solid line) for a sample which is penetrated by the scanning probe microscope (SPM) tip. Also shown is the force curve (dashed line) when the tip encounters a hard surface (glass) and schematic drawings of the relative positions of the SPM tip and the sample surface as related to the force curves. (From Huson, M.G. and Maxwell, J.M., Polym. Test., 25, 2, 2006.)... 

FIGURE 9.16 Resilience values for chlorobutyl rubber (CIIR), butadiene rubber (BR), unfilled natural rubber (NR), filled natural rubber (SRB), and polyurethane (PU) samples tested using a Shore rebound resibometer, an Instron compression tester and a scanning probe microscope (SPM). (From Huson, M.G. and Maxweb, J.M.,... 

FIGURE 10.1 Basic principle of a scanning probe microscope (SPM). 

The capabilities of scanning probe microscopes (SPMs) have not yet been fully applied to MOMs ... 

Scanning probe microscopes (SPMs) have dramatically increased our possibilities for analyzing surfaces. The two most important representatives from the family of scanning probe... 

The conductance of SAMs produced from an alkanethiol and various aromatic and OPE thiols was measured using a tuning fork-based scanning probe microscope (SPM).45 The experimental set-up is illustrated in Figure 5.8. NDR effects were seen in some of the SAMs from the OPEs while the alkanethiolate SAM did not exhibit NDR behavior. 

FIGURE 5.8. The experimental setup for measuring the conductance of SAMs using a tuning fork-based scanning probe microscope (SPM). 

Since 1981, researchers have developed a number of modifications of the STM for uses in which the original instrument is not suitable. For example, the atomic force microscope (AFM) was invented in 1986 by Binnig and Christoph Gerber at IBM-ZRL and Calvin Quate at Stanford University. The AFM can be used on nonconductive surfaces, such as organic materials, on which the STM cannot he used. Today the STM, AFM, and related devices are collectively known as scanning probe microscopes (SPMs). 

The concept of the STM has initiated, besides the AFM, a huge family of scanning probe microscopes (SPM), including lateral force microscopes and scanning near field optical microscopes. All these instruments are built up in a very similar way and differ only in the detected interaction between the probe and the sample. We start our discussion with a summary of the common essential parts of all SPMs. 

Abstract. Arrangement of DNA based structures on mica and modified Si surfaces is investigated by methods of scanning probe microscope (SPM) and spectroscopic ellipso-metry (SE). DNA strands are deposited from a colloidal solution on the surfaces at room temperature. The surfaces were additionally modified with Ag nanoparticles by special technology. The surface structures are visualized by SPM. The effect of the multicomponent structures on the optical response of complex hybrid structures is studied. The optical response of the hybrid samples is related to the contributions of DNA and Ag nanoparticles on the Si surfaces. Formation of combined structures based on Ag nanoparticles and DNA strands is discussed. 

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