Scanning electron microscopy oxide layer thickness

Bond failure may occur at any of the locations indicated in Fig. 1. Visual determination of the locus of failure is possible only if failure has occurred in the relatively thick polymer layer, leaving continuous layers of material on both sides of the fracture. The appearance of a metallic-appearing fracture surface is not definite proof of interfacial failure since the coupling agent, polymer films, or oxide layers may be so thin that they are not detectable visually. Surface-sensitive techniques such as X-ray photoelectron spectroscopy (XPS) and contact angle measurements are appropriate to determine the nature of the failure surfaces scanning electron microscopy (SEM) may also be helpful if the failed surface can be identified. 

Concerning the two-layer model, the thickness and properties of each layer depend on the nature of the electrolyte and the anodisation conditions. For the application, a permanent control of thickness and electrical properties is necessary. In the present chapter, electrochemical impedance spectroscopy (EIS) was used to study the film properties. The EIS measurements can provide accurate information on the dielectric properties and the thickness of the barrier layer [13-14]. The porous layer cannot be studied by impedance measurements because of the high conductivity of the electrolyte in the pores [15]. The total thickness of the aluminium oxide films was determined by scanning electron microscopy. The thickness of the single layers was then calculated. The information on the film properties was confirmed by electrical characterisation performed on metal/insulator/metal (MIM) structures. 

Scanning electron microscopy (SEM) Pig. 10, revealed an increase in the surface concentration of copper domains following additional cure. An increase in the thickness of the copper oxide layer from approximately 700 A to 1300 k was also noted by transmission electron microscopy. Post-processing was considered by the authors to be analogous to sintering wherein, small particles fuse to become a large solid mass. 

The role of silica-only systems on adhesion has been studied using model compounds with squalene [59]. It was shown that the mechanism for increased adhesion to brass-coated wire-to-rubber was not just a simple improvement of the physical properties of the rubber, but that silica moderated the thickness and composition of the interfacial layer by a chemical interaction. SEM-EDX (scanning electron microscopy with energy dispersive analysis of X-rays), XPS, AES and PIXE (proton induced X-ray emission spectroscopy) revealed that silica affected the relative concentrations of compounds present in the interfacial layer, promoting zinc oxide formation in particular. 

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