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Resonant Raman Auger

In addition, the observed width of an Auger line is also affected by the spectrometer resolution. However, the bandpass of the incident radiation which produces the initial state for the Auger decay does not play a role, unlike in the case of the width of an observed photoline. (This statement only holds for the two-step model of inner-shell ionization and subsequent Auger decay. In the vicinity of the inner-shell ionization threshold it significantly fails due to postcollision interaction (Section 5.5) and the resonant Raman Auger effect (Section 5.1.2.1).) Hence, Auger transitions often appear in the spectra of ejected electrons as lines much sharper than the corresponding photolines. [Pg.88]

Auger Resonant Raman Processes Effects of the Partial Density of Unoccupied Electronic States on Resonant KLL Auger Spectra in... [Pg.175]

AUGER RESONANT RAMAN PROCESSES EFFECTS OF THE PARTIAL DENSITY OF UNOCCUPIED ELECTRONIC STATES ON RESONANT KLL AUGER SPECTRA IN Cu AND Ni METALS... [Pg.183]

In atoms and molecules, shakeup satellites, corresponding to internal electronic transitions, are routinely observed using photoelectron and resonant Raman spectroscopy. In particular, shakeup satellites can be observed in the two particle spectrum, i.e., when two holes are left in the final state of an atom after electron emission. Satellite s strength can be strongly enhanced in the presence of a resonant intermediate state. For example, in copper atoms, the incident photon can first excite the core 3p electron to the 4s shell the core hole then decays to the 3d shell through the Auger process (with electron ejected from 3d shell) leaving two 3d holes in the final state [48]. For recent reviews of extensive literature the reader is referred to Refe. [49,50]). [Pg.234]

Miscellaneous. NIST has a reference database of criticaUy evaluated x-ray photoelectron and Auger spectral data, which is designed to mn on PCs. It is searchable by spectral lines as weU as by element, line energy, and chemical data (82). The Nuclear Quadrapole Resonance Spectra Database at Osaka University of over 10,000 records is avaUable in an MS-DOS version (83). The NCLl system, SDBS, has esr and Raman spectra, along with nmr, ir, and ms data, as described. [Pg.121]

Spectroscopy produces spectra which arise as a result of interaction of electromagnetic radiation with matter. The type of interaction (electronic or nuclear transition, molecular vibration or electron loss) depends upon the wavelength of the radiation (Tab. 7.1). The most widely applied techniques are infrared (IR), Mossbauer, ultraviolet-visible (UV-Vis), and in recent years, various forms ofX-ray absorption fine structure (XAFS) spectroscopy which probe the local structure of the elements. Less widely used techniques are Raman spectroscopy. X-ray photoelectron spectroscopy (XPS), secondary ion imaging mass spectroscopy (SIMS), Auger electron spectroscopy (AES), electron spin resonance (ESR) and nuclear magnetic resonance (NMR) spectroscopy. [Pg.139]

Several factors have contributed to this goal in the recent past development of electrochemical techniques for the study of complex reactions at solid electrodes, use of physical methods such as ESCA, Auger, LEED, etc. for the study of surfaces in the ultrahigh vacuum (UHV) environment and in situ techniques under the same conditions as the electrode reaction. Ellipsometry, electroreflectance, Mossbauer, enhanced Raman, infrared, electron spin resonance (ESR) spectroscopies and measurement of surface resistance and local changes of pH at surfaces were incorporated to the study of electrode kinetics. [Pg.66]

Altered surfaces have been inferred from solution chemistry measurements (e.g., Chou and Wollast, 1984, 1985) and from spectroscopic measurements of altered surfaces, using such techniques as secondary ion mass spectrometry (for altered layers that are several tens of nm thick (e.g., Schweda et al, 1997), Auger electron spectroscopy (layers <10 nm thick (e.g., Hochella, 1988), XPS (layers <10 nm thick (e.g., Hochella, 1988 Muir et al, 1990), transmission electron microscopy (TEM, e.g., Casey et al, 1989b), Raman spectroscopy (e.g.. Gout et al, 1997), Fourier transform infrared spectroscopy (e.g., Hamilton et al, 2001), in situ high-resolution X-ray reflectivity (Farquhar et al, 1999b Fenter et al, 2003), nuclear magnetic resonance (Tsomaia et al, 2003), and other spectroscopies (e.g., Hellmann et al, 1997). [Pg.2337]

Many spectroscopic methods, such as atomic absorption, Auger, electron spin resonance, Fourier transform infrared, laser photopyroelectrie effect, mass, Mossbauer, near infrared, nuclear magnetic resonance, positron annihilation lifetime, Raman, time-of-flight secondary mass, x-ray, x-ray photoelectron, and UV were used in various studies of PVC. The relevance and usefulness of these methods is discussed in detail elsewhere. ... [Pg.34]


See other pages where Resonant Raman Auger is mentioned: [Pg.332]    [Pg.332]    [Pg.337]    [Pg.332]    [Pg.332]    [Pg.337]    [Pg.27]    [Pg.191]    [Pg.193]    [Pg.191]    [Pg.193]    [Pg.183]    [Pg.49]    [Pg.1]    [Pg.536]    [Pg.285]    [Pg.149]    [Pg.66]    [Pg.23]    [Pg.17]    [Pg.89]    [Pg.339]    [Pg.216]    [Pg.336]    [Pg.10]    [Pg.10]    [Pg.492]   
See also in sourсe #XX -- [ Pg.88 , Pg.191 ]

See also in sourсe #XX -- [ Pg.88 , Pg.191 ]




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