Scanning electron microscopy resolution

It is now possible to observe nanometer features on the surfaces of zeolitic materials using high-resolution scanning electron microscopy. By taking ibidem measurements in combination with atomic force microscopy we are able to illustrate the strengths and weaknesses of both techniques and judge respective resolving power. 

Inaga S, Osatake H, Tanaka, K. SEM images of DNA double hehx and nucleosomes observed by ultrahigh-resolution scanning electron microscopy. J Electron Microsc 1991 40 181-186. 

Tanaka K, Mitsushima A, Yamagata N, Kashima Y, Takayama H. Direct visualization of colloidal gold-bound molecules and a cell surface receptor by ultrahigh resolution scanning electron microscopy. J Microsc 1990 161 455—461. 

Goldberg MW, Allen TD. High resolution scanning electron microscopy of the nuclear envelope demonstration of a new, regular, fibrous lattice attached to the baskets of the nucleoplasmic face of the nuclear pores. J Cell Biol 1992 119(6) 1429-1440. 

Blackson, J., Garcia-Meitin, E., and Darus, M., High Resolution Scanning Electron Microscopy Examination of Polymer Morphology, Microscopy and Microanalysis, 13 (Suppl. 02), 1062 (2007)... 

Lamatsch, D.K., Sharbel, T.F., Martin, R. and Bock, C. (1998) A drop technique for flatworm chromosome preparation for light microscopy and high-resolution scanning electron microscopy. Chromosome Research 6, 654-656. 

Centonze, V. E., Chen, Y., Severson, T. J., Borisy, G. G., and Nibert, M. L. (1995). Visualization of single reovirus particles by low-temperature, high-resolution scanning electron microscopy./. Struct. Biol. 115, 215-225. 

The solid state displacement reaction method and wet chemical precipitation method were employed for synthesizing the ceria powders, and thus the ceria properties showed different features in several experiments. Figure 15.10 shows the morphology of the ceria particles observed with high-resolution scanning electron microscopy (SEM S900, Hitachi, Japan) and transmission electron microscopy (TEM JEM-2010, JEOL, Japan). In the figure, the ceria particles have a polyhedral shape. Both of the powders have nearly the same size. The primary particle size is approximately 40 mn. However, the difference in crystal shape of the ceria particles was found on TEM analysis. 

Use of high-resolution scanning electron microscopy (SEM) allowed the uncovering of a further substructure in these polymer-fullerene blends, besides some larger fullerene clusters (see Fig. 24) MDMO-PPV nanospheres representing a coiled polymer conformation were detected together with some solvent-dependent amount of PCBM fullerenes [55,60-62,137]. 

Si Al ratio of the outer layers (ca. 10 A) of the zeolite crystals. The extent to which the surface composition differs from the bulk composition appears to depend on preparation conditions, and all three possible situations (silicon rich surface, silicon deficient surface and surface composition equal to bulk composition) have been reported (refs. 12-14). Variations in aluminium distribution have also been probed by high resolution scanning electron microscopy (ref. 15) and energy dispersive X-ray analysis (ref. 16). 

Analysis methods, used for the investigation of modified surfaces and interfaces, are briefiy reviewed. Emphasis is on the combination of chemical, structural/ morphological, electronic, and optical characterization. Many techniques such as transmission electron microscopy (TEM), standard X-ray photoelectron spectroscopy (XPS) using A1 or Mg K radiation, high-resolution scanning electron microscopy (HRSEM), and standard scanning probe microscopies (AEM in contact... 

In a typical treatment of polyethylene, 1-2 pm is removed from the surface, with the reagent attacking preferentially the non-crystalline material. The surface can then be studied either by two-stage replication or by high-resolution scanning electron microscopy (SEM). The latter gives somewhat lower resolution than TEM, but is much easier to use than the production of replicas. In this technique scattered or secondary electrons emitted from the surface are collected as an electron beam is scanned across it in a raster like that used to produce a television picture and the image is built up in a similar way from the intensity detected. 

Reipert, S., Reipert, B. M., and Allen, T. D. (1994). Preparation of isolated nuclei from K562 haemopoietic cell line for high resolution scanning electron microscopy. Microsc. Res. Tech. 29, 54-61. 

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