Process parameters, advanced electric

Concurrently design test structures and develop test models dedicated solely to extracting critical model parameters from electrical precision measurements on the wafer level. Improve fabrication processes using test structures early in the sensor development phase and well in advance of starting production. Eventually, reduce the number of test structures and the wafer space they occupy, optimize testing time and equipment, and then commit a test setup to production. 

The availability of genetically modified mice has advanced our understanding of several neurodegenerative processes. Cellular neurobiology experiments have informed us about mechanisms of neuronal dysfunction in AD and PD mouse models. For instance, recent studies have identified that synaptic transmission is one of the earliest events in the cognitive abnormalities that characterize AD and PD. The integration of this information with data-based circuits modeling, in which neuronal electrical properties, synaptic transmission parameters, and brain oscillations can now be evaluated and it has been recently addressed in PD and AD. 

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