Powder characterization inductively coupled plasma

Characterization of materials was achieved by powder X-ray diffraction, using a Siemens D500 diffractometer, and by scanning electron microscopy. Elemental analysis of pure single phase materials was carried out using a Jarrel Ash Inductively Coupled Plasma Atomic Emission Spectrometer. 

The as-synthesized and calcined CrAPO-5 and CrS-1 were characterized by X-ray diffraction (XRD) using a Phillips PW 1877 automated powder diffractiometer with CuKa radiation. Inductively coupled plasma-atomic emission spectrometric (ICP-AES) analysis was carried out to determine the Cr content. 

The toxicity of the mineral is such that quantitative characterization of erionite is extremely important. Samples should be characterized by using one or more of the following techniques (1) powder X-ray diffraction, (2) electron probe microanalysis or inductively coupled plasma-mass spectroscopy, (3) scanning electron microscopy equipped with wavelength dispersive spectroscopy (WDS) and/or energy dispersive spectroscopy (EDS), (4) transmission electron microscopy equipped with WDS and/or EDS and selected area electron diffraction, and (5) similar or better analytical techniques. 

Precursors and catalysts were characterized in ambient conditions by X-ray diffraction (XRD) on a Rigaku Powder Diffractometer using CuK radiation with a Ni filter. LiF was used as an internal standard for the activated catalysts. Laser Raman spectra (LRS) were collected using Ar ion laser excitation (514.5 nm) at a power of 25 mW at the sample. Spectra for the precursors were collected in ambient conditions, and reaction-used catalysts were characterized in-situ at 400°C in a 70 ml/min flow of C4H,(/02/He (0.99/10.2/88.81). Phosphorus to vanadium ratios (molar) were determined by inductively coupled plasma (ICP). Diffuse reflectance spectra (DRS) were collected in ambient conditions using polytetrafluoroethylene as a reference. 

The prepared catalysts were analyzed by X-ray powder diffraction (XRD), Diffuse Reflectance Spectra (DREAS), Inductive coupled plasma-atomic emission spectrometric analysis (ICP-AES) and scanning electron microscopy (SEM). The catalysts were characterized by XRD before and after calcination, using a Philips PW 1877 automated powder diffractometer with CuKa radiation. DREAS measurements were recorded on a Varian Cary-1 spectrophotometer using BaS04 as a reference. ICP-AES measurements were recorded on a Perkin-Elmer Plasma 40 (ICP) or Perkin-Elmer 1100 (AES). SEM measurements were recorded on a Philips XL-20 microscop. 

The structure of samples was characterized by X-ray diffraction patterns (model M21XVHF22). The micro structure of the samples was observed using a scanning electron microscope (model CAMBRIDGE S-360). The composition of powders was determined by inductively coupled plasma (ICP, INC profile) spectrometry. The thermal behaviors of the precursor powders were studied by differential thermal analysis (DSC, Model TA-Q200) in air, at a heating rate of 20 °C/min. The piezoelectric coefficient of the samples was measured using a quasi-static 33/ 31 meter (model ZJ-6A). 

Inductively coupled plasma-atomic emission spectrometry allows the determination of anionic surfactants (LAS and AS) and inorganic compounds (phosphate, silicate, zeolite, sulfate). Other techniques, such as X-ray fluorescence spectroscopy and X-ray powder diffraction, have been used for the qualitative analysis of inorganic detergents. For surface analysis, optical light microscopy, scanning electron microscopy, and transmission electron microscopy characterize particles, deposition of surfactant, or other detergent ingredients on fabric. 

Common techniques for the characterization of the electrocatalysts include High Resolution Electron Microscopy (HRTEM), Extended X-ray Absorption Fine Stracture Spectroscopy (EXAFS), Energy Dispersive Spectroscopy (EDS), Inductively Coupled Plasma Atomic Emission Spectroscopy (ICP-AES), Near Edge X-ray Absorption Spectroscopy (XANES), X-Ray Powder Diffraction (XRPD), Infrared and Raman Spectroscopy (IR, RS). 

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