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Polymer semiconductor development characterization

SIMS is one of the most powerful surface and microanalytical techniques for materials characterization. It is primarily used in the analysis of semiconductors, as well as for metallurgical, and geological materials. The advent of a growing number of standards for SIMS has gready enhanced the quantitative accuracy and reliability of the technique in these areas. Future development is expected in the area of small spot analysis, implementation of post-sputtering ionization to SIMS (see the articles on SALI and SNMS), and newer areas of application, such as ceramics, polymers, and biological and pharmaceutical materials. [Pg.548]

As a result of the development of probe microscopy, many areas of research have experienced a remarkable progress and the variety of materials that have been visualized and characterized by STM, AFM and/or related techniques is correspondingly broad. These include metals [6], semiconductors [7] and superconductors [8], layered inorganic materials [9] and self-assembled monolayers [10] or polymers [11] and macromolecules (including biomacromolecules) [12,13],... [Pg.2]

Other applications of photochemistry include the development of sensitive fluorescent chemosensors for analysis of dilute solutions of inorganic cations and anions and the study of the diffusion of individual molecules in solution at room temperature. Fluorescent compoimds have been used as replacements for radioisotopes in the analysis of biological compoimds and the study of biologically active compounds and living systems. Photochemical reactions also offer alternative probes for the characterization of the microenvironments in diverse solid and liquid media, including crystals, zeolites, alumina, silica and clay surfaces, semiconductor surfaces, liquid crystals and host-guest inclusion complexes, polymer films, monolayers and supported multilayers of surfactant molecules, mi-celles, and dendrimers. ... [Pg.859]

The molybdenum neopentyUdene complex Mo(CHBu )(NR)(OBu )2 is the active catalyst used in a fascinating development for the synthesis of 11-Vt semiconductor clusters (ZnS, CdS, PbS) and silver and gold nanoclusters of predictable size within microdomains in films of block copolymers prepared by ROMP. Block copolymers of norbomene and a functionalized norbomene that wiU complex with a metal-containing compound were prepared and characterized as monodisperse materials. The functionalized component (amine, alkoxide, or thiolate) then sequestered the metal and the metallated block copolymer was cast into a film which was subsequently treated with H2S to convert the metal into the sulfide. The molybdenum complexes have also featured in the development of the synthesis of side-chain liquid crystal polymers by living ROMP.98 99... [Pg.679]

Using both gas and semiconductor lasers in the different modifications of these instruments, the new LICRM apparatus made it possible to develop a new way for the studies of relaxation dynamics and thermal characterization of polymers and other solids. This new method was later named the laser-interferometric Creep Rate Spectroscopy (CRS). The first publication on this topic appeared in 1984 [10], and the short survey of the earlier smdies, performed with the LICRM setup and the CRS technique, was published in 1994 [11]. [Pg.80]

The experimental techniques which are used for characterization of polymer conductivity are in most cases the techniques adopted from classical physics of insulators, semiconductors, and conductors however, the interpretation of the results requires an imderstanding of the different nature of organic and disordered materials. In particular one has to take into account that in most polymers the charge carrier density and mobility are very low the charge carrier transport has dispersive character and also that polymers are sensitive to enviromnen-tal conditions and can be easily degraded by light, heat, oxygen, moisture, and so Development of new techni-... [Pg.860]


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Polymer characterization

Polymer semiconductor development

Semiconductor characterization

Semiconductor characterized

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