Spectroscopy laser-interferometric creep rate

Laser-Interferometric Creep Rate Spectroscopy of Polymers... 

In this survey, the novel Laser-Interferometric Creep Rate Meter (LICRM) setup and the original method of Creep Rate Spectroscopy (CRS) are described. We present the results of the numerous applications, in particular the new CRS possibilities as the high resolution method for the relaxation spectroscopy and thermal analysis of polymer systems. Furthermore, this method contributes to general progress in studying the deformation properties of polymers and other solids, especially at the micro- and submicrolevels. 

Using both gas and semiconductor lasers in the different modifications of these instruments, the new LICRM apparatus made it possible to develop a new way for the studies of relaxation dynamics and thermal characterization of polymers and other solids. This new method was later named the laser-interferometric Creep Rate Spectroscopy (CRS). The first publication on this topic appeared in 1984 [10], and the short survey of the earlier smdies, performed with the LICRM setup and the CRS technique, was published in 1994 [11]. 

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