Polymer films spectroscopy

One interesting new field in the area of optical spectroscopy is near-field scaiming optical microscopy, a teclmique that allows for the imaging of surfaces down to sub-micron resolution and for the detection and characterization of single molecules [, M]- Wlien applied to the study of surfaces, this approach is capable of identifying individual adsorbates, as in the case of oxazine molecules dispersed on a polymer film, illustrated in figure Bl.22,11 [82], Absorption and emission spectra of individual molecules can be obtamed with this teclmique as well, and time-dependent measurements can be used to follow the dynamics of surface processes. 

When the spectral characteristics of the source itself are of primary interest, dispersive or ftir spectrometers are readily adapted to emission spectroscopy. Commercial instmments usually have a port that can accept an input beam without disturbing the usual source optics. Infrared emission spectroscopy at ambient or only moderately elevated temperatures has the advantage that no sample preparation is necessary. It is particularly appHcable to opaque and highly scattering samples, anodized and painted surfaces, polymer films, and atmospheric species (135). The interferometric... 

In situ electron transport measurements on conducting polymers are commonly made by using a pair of parallel-band electrodes bridged by the polymer [Fig. 9(A)].141142 Other dual-electrode techniques in which the polymer film is sandwiched between two electrodes [Fig. 9(B)],139,140 rotating-disk voltammetry [Fig. 9(C)],60,143 impedance spectroscopy,144,145 chronoamperometry,146 and chronopotentiometry147 have also been used. 

Impedance spectroscopy is best suited for the measurement of electronic conductivities in the range 10 -7to 10 2S cm 1.145 In principle, it is perhaps the best method for this range, but it is often difficult to interpret impedance data for conducting polymer films. The charge-transfer resistance can make measurements of bulk film resistances inaccurate,145 and it is often difficult to distinguish between the film s ionic and electronic resistances.144 This is even more of a problem with chronoamperometry146 and chronopotentiometry,147 so that these methods are best avoided. 

Such effects are observed inter alia when a metal is electrochemically deposited on a foreign substrate (e.g. Pb on graphite), a process which requires an additional nucleation overpotential. Thus, in cyclic voltammetry metal is deposited during the reverse scan on an identical metallic surface at thermodynamically favourable potentials, i.e. at positive values relative to the nucleation overpotential. This generates the typical trace-crossing in the current-voltage curve. Hence, Pletcher et al. also view the trace-crossing as proof of the start of the nucleation process of the polymer film, especially as it appears only in experiments with freshly polished electrodes. But this is about as far as we can go with cyclic voltammetry alone. It must be complemented by other techniques the potential step methods and optical spectroscopy have proved suitable. 

Novotny et al. [41] used p-polarized reflection and modulated polarization infrared spectroscopy to examine the conformation of 1 -1,000 nm thick liquid polyperfluoropropy-lene oxide (PPFPO) on various solid surfaces, such as gold, silver, and silica surfaces. They found that the peak frequencies and relative intensities in the vibration spectra from thin polymer films were different from those from the bulk, suggesting that the molecular arrangement in the polymer hlms deviated from the bulk conformation. A two-layer model has been proposed where the hlms are composed of interfacial and bulk layers. The interfacial layer, with a thickness of 1-2 monolayers, has the molecular chains preferentially extended along the surface while the second layer above exhibits a normal bulk polymer conformation. 

Polymer films were produced by surface catalysis on clean Ni(100) and Ni(lll) single crystals in a standard UHV vacuum system H2.131. The surfaces were atomically clean as determined from low energy electron diffraction (LEED) and Auger electron spectroscopy (AES). Monomer was adsorbed on the nickel surfaces circa 150 K and reaction was induced by raising the temperature. Surface species were characterized by temperature programmed reaction (TPR), reflection infrared spectroscopy, and AES. Molecular orientations were inferred from the surface dipole selection rule of reflection infrared spectroscopy. The selection rule indicates that only molecular vibrations with a dynamic dipole normal to the surface will be infrared active [14.], thus for aromatic molecules the absence of a C=C stretch or a ring vibration mode indicates the ring must be parallel the surface. 

Polymer films were produced by anodic deposition by potentiostatic deposition onto a platinum electrode. Deposition was done from 1 M solutions of the monomer in 1M LiC104 in acetonitrile. The films were characterized by cyclic voltammetry and reflection infrared spectroscopy in an apparatus described elsewhere [15]. 

Lithography and Spectroscopy of Ultrathin Langmuir—Blodgett Polymer Films... 

One of the major obstacles to investigating ultrathin polymer films is the small amount of detectable sample material and, as a result, high instrument sensitivity is crucial. Although polarized Fourier Transform Infrared Spectroscopy (13.141 has... 

The use of thin polymer films allowed the reaction of supported [Rh(CO)2 t]- with Mel to be monitored directly, by in situ IR spectroscopy. The reactivity was very similar to that found in solution, with oxidative addition of... 

In this application, the process analyzer is used in the vis-NIR spectral region to measure the clear top layer on a co-extruded polymer film. The bottom layer is pigmented to an opaque white color and its thickness cannot be determined by this method. Prior to the installation of the fiber-optic spectroscopy system, film samples were measured manually in the laboratory by a subtractive scheme. First, the total thickness of a sample was measured on a manual profilometer. The top layer of the polymer was removed with methylene chloride. The sample was then repositioned on the profilometer as closely as possible to the originally measured spot and the thickness of the second white layer was determined. The thickness of the top layer was then determined by difference. 

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