Big Chemical Encyclopedia

Chemical substances, components, reactions, process design ...

Articles Figures Tables About

Plate loading

ASTM, Standard Test Method for Determination of External Loading Characteristics of Plastic Pipe by Parallel-Plate Loading, ASTM D2412-02, American Society for Testing and Materials, West Conshohocken, PA, 2002. [Pg.1153]

Apparent tensile strength of tubular (pipe) products by the split disk method External loading characteristics of plastic pipe by parallel plate loading Compressive properties of plastics Adhesion of rubbers to metallic substrates (Procedure E1)... [Pg.305]

The ChemHTS-1 module of Chem-X provides integration to plate samples, copy plates, load analysis validation data and request biological testing. A simple set of ORACLE tables ensure speed and flexibility (tables 5-7). [Pg.188]

Here the solution of Dugdale will be followed since it clearly shows a significant feature of the model. A flat elliptical hole of length 2c is considered in an infinite plate loaded in tension by a stress a remote from and normal to the ellipse. The ends of the ellipse terminate in small plastic zotees whose boundaries are under uniform internal pressure stresses (see Fig. 2.2). For these internal stresses static equilibrium is achievai by imposing equal and compressive opposite stresses ct,.. This... [Pg.143]

Figure 10.1 Comparison of band profiles derived from the Houghton and the Haarhoff-Van der Linde equations. Parabolic isotherm q = 20C(1 5C). L = 25 cm F = 0.25 fp = 200 s N = 12,500 theoretical plates. Loading factor 1%. 1, convex-upward isotherm 2, convex-downward isotherm. The Houghton profiles are identified by squares. The masses lost by the Houghton profiles are 5.3% and -4.5%, respectively. Reproduced with permis-sionfrom S. Golshan-Shirazi and G. Guiochon, J. Chromatogr., 506 (1989) 495 (Fig. 2). Figure 10.1 Comparison of band profiles derived from the Houghton and the Haarhoff-Van der Linde equations. Parabolic isotherm q = 20C(1 5C). L = 25 cm F = 0.25 fp = 200 s N = 12,500 theoretical plates. Loading factor 1%. 1, convex-upward isotherm 2, convex-downward isotherm. The Houghton profiles are identified by squares. The masses lost by the Houghton profiles are 5.3% and -4.5%, respectively. Reproduced with permis-sionfrom S. Golshan-Shirazi and G. Guiochon, J. Chromatogr., 506 (1989) 495 (Fig. 2).
Figure 10.10 Comparison between the band profiles predicted by the ideal and the equilibrium- dispersive models for a Langmuir isotherm. Constant apparent loading factor, m = [fco/(l -h l(Q)] NLf = 35. (a) Classical C vs. t profile. Sample size given as loading factor column efficiency, see Figure 10.10b. (b) Reduced profiles, plots of bC vs. t — to)/ (fR,o — to). Efficiency in number of plates loading factor see Figure 10.10a. Figure 10.10 Comparison between the band profiles predicted by the ideal and the equilibrium- dispersive models for a Langmuir isotherm. Constant apparent loading factor, m = [fco/(l -h l(Q)] NLf = 35. (a) Classical C vs. t profile. Sample size given as loading factor column efficiency, see Figure 10.10b. (b) Reduced profiles, plots of bC vs. t — to)/ (fR,o — to). Efficiency in number of plates loading factor see Figure 10.10a.
IonWorks HT Load the reservoir in the buffer position with 4 ml PBS and cell position with cell suspension. Pipette the test compound, vehicle control, and positive control (threefold above the final concentration, DMSO <0.33 %) in a 96-well V-bottom plate. Load the plate in plate 1 position, and clamp PatchPlate into the PatchPlate station. With the fluidics-head (F-head) add 3.5 pi PBS to each well of PatchPlate and perfuse its underside with internal solution. Prime and de-bubble the electronics head (E-head), and perform hole test by applying voltage pulse. Dispense 3.5 pi of cell suspension in each well of PatchPlate with F-head. Allow 200 s for cells to reach the hole in each well, and seal it. Determine the seal resistance in each well with E-head. Change the underside solution of PatchPlate with access solution. After 9 min (perforation time) perform pre-compound hERG current measurements with E-head. Add 3.5 pi solution from each well of compound plate to 4 wells on a PatchPlate . [Pg.58]

Figure 3.3. Each vertical strip in the top panel is from an individual well of a 96-well plate loaded with fluorescent beads. Two rows, 24 wells, of the plate are shown. The bottom panel represents a onedimensional histogram for a single well. Data was collected on a Cytomation MoFlo FACS equipped with a Moskito autosampler. Figure 3.3. Each vertical strip in the top panel is from an individual well of a 96-well plate loaded with fluorescent beads. Two rows, 24 wells, of the plate are shown. The bottom panel represents a onedimensional histogram for a single well. Data was collected on a Cytomation MoFlo FACS equipped with a Moskito autosampler.
Figure 1.7. Schematic illustration of the fracture behavior of a centrally cracked plate loaded... Figure 1.7. Schematic illustration of the fracture behavior of a centrally cracked plate loaded...
Figure 1.8. Schematic illustration of the influence of time (or strain rate, or crack velocity) on the fracture behavior of a centrally cracked plate loaded in uniform remote tension. Figure 1.8. Schematic illustration of the influence of time (or strain rate, or crack velocity) on the fracture behavior of a centrally cracked plate loaded in uniform remote tension.
Fig. 6 Equivalent circuits of a a viscoelastic layer of thickness 2h, b two viscoelastic layers of thickness 2hi and 2h2 (where 1 denotes the quartz crystal and 2 denotes the film), and c a piezoelectric plate loaded on one side with a load AZi. The parameter h is half of the thickness of the respective layer... Fig. 6 Equivalent circuits of a a viscoelastic layer of thickness 2h, b two viscoelastic layers of thickness 2hi and 2h2 (where 1 denotes the quartz crystal and 2 denotes the film), and c a piezoelectric plate loaded on one side with a load AZi. The parameter h is half of the thickness of the respective layer...
Figure 6-10. Interferograms ball on plate. Load 71.2 N. Speed, cm/s (a) 0, (b) 3.2, (c) 28.6. Arrow shows direction of rotation. After Gohar and Cameron [14]. Figure 6-10. Interferograms ball on plate. Load 71.2 N. Speed, cm/s (a) 0, (b) 3.2, (c) 28.6. Arrow shows direction of rotation. After Gohar and Cameron [14].
The majority of baffles are flat and as a result are very inefficient from a strength standpoint. Deflection is the governing case for flat plates loaded on one side. Tire preference is to have unstiffened baffles, and they should always be the first choice. This will be acceptable for small baffles. However, lor larger baffles, as the baffle thickness becomes excessive, stiffeners offer a more economical design. Therefore stiffeners are frequently used to stiffen the baffle to prevent the thickness of the baffle from becoming e.xces-sive. The number, size, and spacing of stiffeners are dependent on the baffle thickness. selected. There is a continual trade-off between baffle thickness and stiffener parameters. [Pg.227]

The plate load test is well known and, like the standard penetration test, has been in use for a long time period, but neither of these two tests is used very often when the water depth is greater than about 30 m. A limited niunber of plate bearing tests (plate loading test [PLT]) have been carried out at three locations in the North Sea typically, a seabed jacking system has been used to load the plates. The main limitation of the PLT is that it only tests the upper 0.5-1.0 m, luiless it is of the screw-plate type (Kummeneje, 1955 Schmertmann, 1970). [Pg.125]

Results of two plate load tests in a dense North Sea sand. (After Andresen, A. et al., Marine Geotech., 3,201-266, 1979. Reprinted with permission of Taylor Francis Group.)... [Pg.127]

GEOIIETRICAL PARAMETERS OF STRESS CONCENTRATION FACTORS AROUND A CIRCULAR HOLE IN A PLATE LOADED THROUGH A PIM IN THE HOLE... [Pg.285]


See other pages where Plate loading is mentioned: [Pg.542]    [Pg.238]    [Pg.213]    [Pg.607]    [Pg.239]    [Pg.219]    [Pg.239]    [Pg.488]    [Pg.228]    [Pg.134]    [Pg.1114]    [Pg.607]    [Pg.110]    [Pg.161]    [Pg.73]    [Pg.338]    [Pg.21]    [Pg.1113]    [Pg.245]    [Pg.156]    [Pg.157]    [Pg.400]    [Pg.402]    [Pg.780]    [Pg.120]    [Pg.284]    [Pg.266]    [Pg.334]    [Pg.335]    [Pg.339]    [Pg.11]    [Pg.87]   
See also in sourсe #XX -- [ Pg.254 ]

See also in sourсe #XX -- [ Pg.559 ]




SEARCH



BUCKLING OF SIMPLY SUPPORTED LAMINATED PLATES UNDER IN-PLANE LOAD

DEFLECTION OF SIMPLY SUPPORTED LAMINATED PLATES UNDER DISTRIBUTED TRANSVERSE LOAD

Plate loading tests

© 2024 chempedia.info