Photoelectron spectroscopy information obtainable

Other techniques utilize various types of radiation for the investigation of polymer surfaces (Fig. 2). X-ray photoelectron spectroscopy (XPS) has been known in surface analysis for approximately 23 years and is widely applied for the analysis of the chemical composition of polymer surfaces. It is more commonly referred to as electron spectroscopy for chemical analysis (ESCA) [22]. It is a very widespread technique for surface analysis since a wide range of information can be obtained. The surface is exposed to monochromatic X-rays from e.g. a rotating anode generator or a synchrotron source and the energy spectrum of electrons emitted... 

Quantitative information about energies of atomic orbitals is obtained using photoelectron spectroscopy, which applies the principles of the photoelectric effect to gaseous atoms. Our Box (on the next page) explores this powerful spectroscopic technique. 

Most of what we know about the structure of atoms and molecules has been obtained by studying the interaction of electromagnetic radiation with matter. Line spectra reveal the existence of shells of different energy where electrons are held in atoms. From the study of molecules by means of infrared spectroscopy we obtain information about vibrational and rotational states of molecules. The types of bonds present, the geometry of the molecule, and even bond lengths may be determined in specific cases. The spectroscopic technique known as photoelectron spectroscopy (PES) has been of enormous importance in determining how electrons are bound in molecules. This technique provides direct information on the energies of molecular orbitals in molecules. 

In the present study the surface chemistry of birnessite and of birnessite following the interaction with aqueous solutions of cobalt(II) and cobalt(III) amine complexes as a function of pH has been investigated using two surface sensitive spectroscopic techniques. X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS). The significant contribution that such an investigation can provide rests in the information obtained regarding the chemical nature of the neat metal oxide and of the metal oxide/metal ion adsorbate surfaces, within about the top 50 of the material surface. The chemical... 

The significance of the development of photoelectron spectroscopy over the last decade for a better understanding of solid surfaces, adsorption, surface reactivity, and heterogeneous catalysis has been discussed. The review is illustrative rather than exhaustive, but nevertheless it is clear that during this period XPS and UPS have matured into well-accepted experimental methods capable of providing chemical information at the molecular level down to 10% or less of a monolayer. The information in its most rudimentary state provides a qualitative model of the surface at a more sophisticated level quantitative estimates are possible of the concentration of surface species by making use of escape depth and photoionization cross-section data obtained either empirically or by calculation. 

The values of the ESP at the nuclear positions, as obtained from the electron and Hartree-Fock structure amplitudes for the mentioned crystals (using a K-model and corrected on self-potential) are given in table 2. An analysis shows that the experimental values of the ESP are near to the ab initio calculated values. However, both set of values in crystals differ from their analogs for the free atoms [5]. It was shown earlier (Schwarz M.E. Chem. Phys. Lett. 1970, 6, 631) that this difference in the electrostatic potentials in the nuclear positions correlates well with the binding energy of Is-electrons. So an ED-data in principle contains an information on the bonding in crystals, which is usually obtaining by photoelectron spectroscopy. 

Spectroscopic methods, especially photoelectron spectroscopy, permit to obtain the same information directly. They will be discussed in Chap. E. 

X-ray photoelectron spectroscopy (XPS) has been used to obtain stoichiometric information about MC/LB films and also to identify possible oxidation states of, primarily, the inorganic components of the films. These include CdS (37,64,79), CdSe (75), CuS.v (9,19,39), HgS (22,45,64), PbS (39,68,70), and MS, (M = Pt, n — 2 or 4 M = Pd, n = 2) (10,74). Sulfunmetal and carbommetal ratios comprise the main stoichiometric information obtained from XPS data. While there are claims to the contrary (39), there is little support from XPS data for a stoichiometric reaction between divalent metal ions in LB films with H2X as depicted in Eq. (4) (i.e., chalcogenide metal = 1). In most instances the chalcogenide meta ratio is found... 

Spectroscopy provides one of the few tools available for probing the inner workings of molecules. Infrared and Raman spectroscopies provide information from which force constants and information about charge distributions can be obtained. Ultraviolet spectroscopy gives information on the nature of the electronically excited states of molecules, and is directly connected with their photochemical transformations. Photoelectron spectroscopy gives information on the nature of the radical cations that may be formed by ionization of a molecule, and NMR spectroscopy can give information on the hybridization associated with a given bond. As a result of the level of information that may be obtained, there have been a number of spectroscopic studies. 

X-ray photoelectron spectroscopy (XPS), 787, 794 information obtained from, 796 X-rays, definition, 794... 

The primary techniques used in this study include X-ray photoelectron spectroscopy (XPS), reflection-absorption infrared spectroscopy (RAIR), and attenuated total reflectance infrared spectroscopy (ATR). XPS is the most surface-sensitive technique of the three. It provides quantitative information about the elemental composition of near-surface regions (< ca. 50 A sampling depth), but gives the least specific information about chemical structure. RAIR is restricted to the study of thin films on reflective substrates and is ideal for film thicknesses of the order of a few tens of angstroms. As a vibrational spectroscopy, it provides the type of structure-specific information that is difficult to obtain from XPS. The... 

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