Photoelectron emission microscopy PEEM

Fig. 7.27 Photoelectron emission microscopy (PEEM) images of two Fe3C>4 surfaces that were used as model catalyst in the dehydrogenation of ethylbenzene to styrene at 870 K, showing carbonaceous deposits (bright). These graphitic deposits grow in dots and streaks on a surface of low defect density, but form dendritic structures on surfaces rich in point and step defects. (From [78]).

The photoelectron emission microscopy (PEEM) investigations of Imbihl and coworkers [91] (Eigure 22) have nicely confirmed not only the potential-controlled variation in the work function of model Pt electrodes deposited on YSZ but also the Eermi-level pinning between Pt and YSZ. 

Among the related methods, specific experimental designs for applications are emphasized. As in-system synchrotron radiation photoelectron spectroscopy (SRPES) will be applied below for chemical analysis of electrochemically conditioned surfaces, this method will be presented first, followed by high-resolution electron energy loss spectroscopy (HREELS), photoelectron emission microscopy (PEEM), and X-ray emission spectroscopy (XES). The latter three methods are rather briefly presented due to the more singular results, discussed in Sections 2.4-2.6, that have been obtained with them. Although ultraviolet photoelectron spectroscopy (UPS) is an important method to determine band bendings and surface dipoles of semiconductors, the reader is referred to a rather recent article where all basic features of the method have been elaborated for the analysis of semiconductors [150]. 

Microscopy contains scanning tunneling microscopy (STM) and photoelectron emission microscopy (PEEM). 

The PEEM technique (photoelectron emission microscopy),58 which additionally allows for spatial resolution of about 1 mm2. 

Most of the published work deals with films produced by these alternative additives to ZnDTPs under tribological and/or pure thermal conditions. Several analytical techniques have been employed to characterize the reaction layers, such as X-ray photoelectron spectroscopy (XPS) [7, 12, 14, 25, 26], X-ray absorption spectroscopy (XAS) [13, 21-24], X-ray photoelectron emission microscopy (X-PEEM) [24], scanning electron microscopy (SEM) [20, 21], Fourier transform infrared spectroscopy (FT-IR)... 

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