Peak volume registration

Figure 4.4 Influence of the peak volume registration scheme on the sensitivity and working range in the case of (a) silver at 328.068 nm and (b) indium at 303.936 nm...

Figure 4.3 Definition of center pixel (M), peak volume (Mj ) and side pixel (Nj ) registration...

X-ray powder diffraction patterns were obtained on oriented film specimens [7] (2 to 45° 2 , Philips PW 1120, monochromatized CuKa radiation, continuous peak registration). BET surface area and the pore volume distribution were determined from Nj adsorption-desorption isotherms at 77 K (degassing at 393 K, lO" mbar, 5h Sorptomatic 1900, Carlo Erba Instruments). The IR-spectra were recorded on KBr wafers [4] with a Specord 80M spectrometer. The XPS (X-ray photoelectron spectroscopy) spectra were obtained with VG ESCALAB 200 MKII spectrometer equipped with a twin anode AIKa source (1486 eV). The thermogravimetric (TGA) analyses were carried out with a Setaram TG 85 thermobalance at a heating rate of 6 K min in a helium flow of 30 ml min . The chromium content of the samples was determined by EPMA (JEOL 840 scanning electron microscope) with energy dispersive spectrometer (EDS, Tracer Northern) and by AAS (atomic absorption spectroscopy, Perkin Elmer 3030) analyses. 

As mentioned above, using HR-CS AAS, signal registration cannot only be done at the CP M, corresponding to the line core, as in conventional LS AAS, but also using the volume Ma, of the absorption peak with an increasing number of pixels, or the side pixels Na, only, as shown in Figure 4.3. 

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