Big Chemical Encyclopedia

Chemical substances, components, reactions, process design ...

Articles Figures Tables About

Nanobeam

Application. Micro- and nanobeam optics are used to demagnify the cross-section of the primary beam. By means of the respective setups structure variation in inhomogeneous materials can be studied with micrometer or nanometer size resolution, respectively. For this purpose the sample is moved through the beam while... [Pg.65]

Nanobeam optics with beam diameters of several nanometers are presently developed at the ESRF. Using a Kirkpatrick-Baez optical system (cf. Fig. 4.9) beam diameters of 80 nm have been achieved. The Kirkpatrick-Baez system is made from two successively reflecting, orthogonal mirrors that are bent into elliptical shape by mechanical benders. The focused flux is strongly increased by deposition of a graded multilayer structure similar to that used with the parabolic Gobel mirror. [Pg.66]

Gradient Materials are studied at microfocus beamlines with a spatial resolution down to 1 jj.m. Current development of nanobeam optics will soon allow for spatial resolutions down to 50 nm. [Pg.71]

A third area of research, which has the potential to revolutionize powder diffraction, is the focusing of X-rays into very small beams ( nanobeams ). Nanoscience and modem synchrotron diffraction are engaged in a synergetic relationship in which on the one hand nanoscience requires nanoscale X-ray beams to probe nanometer size regions of matter and on the other hand, nanolithography tools... [Pg.4526]

Figure 11.18 (A) SEM and (B) TEM images of bicrystalline silver nanowires (nanobeams). (C) SEM image of a nanobeam tilted at 65° relative to the electron beam, where its rounded profile is visible (the scale bar only applies to the horizontal axis). (D) TEM image of a microtomed sample of silver nanobeams showing their cross-sectional profile. This image suggests that the nanobeam is bisected by a twin plane parallel to the base. Refrinted with permission from reference [59]. (2006) American Chemical Society. Figure 11.18 (A) SEM and (B) TEM images of bicrystalline silver nanowires (nanobeams). (C) SEM image of a nanobeam tilted at 65° relative to the electron beam, where its rounded profile is visible (the scale bar only applies to the horizontal axis). (D) TEM image of a microtomed sample of silver nanobeams showing their cross-sectional profile. This image suggests that the nanobeam is bisected by a twin plane parallel to the base. Refrinted with permission from reference [59]. (2006) American Chemical Society.
Nanobeam Optics (Kirlq)atrick-Baez Mirrors). . 48... [Pg.253]

E.W. Wong, RE. Sheehan, and C.M. Lieber, Nanobeam mechanics elasticity, strength, and toughness of nanorods and nanotubes. Science Til, 1971—1975 (1997). [Pg.495]

Nanobeam Mechanics Elasticity, Strength, and toughness of Nanorods and graphite Nanotubes. ... [Pg.7]

Fig. 3 a TEM image and nanobeam electron diffraction pattern of the PPy nanoparticles prepared using deqdtrimethjdammonium bromide (DeTAB) (0.4 M) at 3°C. b Average change in nanoparticle size as a function of surfactant concentration. The average nanoparticle size was determined by TEM (50 particles counted) (reproduced with permission from [146])... [Pg.208]

The size of focused ion beams has decreased in recent years so that it is now possible to produce beams of order 100 nm in size, i.e., nanobeams. The use of smaller beams with the position scanned microbeam NRA technique will improve the spatial resolution but will decrease the yield. For delicate samples where the current cannot be increased, this... [Pg.4657]

Methodology (PIXE evaluation software packages, detector systems [UTWSi(Li), PIN array], pPIXE chambers with precision goniometer and sample location setup, and nanobeam configurations). [Pg.1712]

Hsu, C, McPhail, D.S. (1996) SIMS linescan profiling of chemically bevelled semiconductors a method of overcoming ion beam induced segregation in depth profiling. In Microbeam and Nanobeam Analysis, edited by Benoit, D., Bresse, J, Van t dack, L., Werner, H., Wemisch, J. Vienna, Austria Springer, pp. 317-324. [Pg.934]


See other pages where Nanobeam is mentioned: [Pg.288]    [Pg.66]    [Pg.518]    [Pg.418]    [Pg.105]    [Pg.816]    [Pg.281]    [Pg.67]    [Pg.6021]    [Pg.314]    [Pg.326]    [Pg.357]    [Pg.701]    [Pg.1842]    [Pg.1844]    [Pg.50]    [Pg.110]    [Pg.145]    [Pg.6020]    [Pg.815]    [Pg.1703]    [Pg.1704]    [Pg.1741]    [Pg.1756]    [Pg.2348]    [Pg.74]   
See also in sourсe #XX -- [ Pg.47 , Pg.48 ]

See also in sourсe #XX -- [ Pg.47 , Pg.48 ]




SEARCH



Nanobeam electron diffraction

Nanobeams

© 2024 chempedia.info