Nanobeam electron diffraction

Fig. 3 a TEM image and nanobeam electron diffraction pattern of the PPy nanoparticles prepared using deqdtrimethjdammonium bromide (DeTAB) (0.4 M) at 3°C. b Average change in nanoparticle size as a function of surfactant concentration. The average nanoparticle size was determined by TEM (50 particles counted) (reproduced with permission from [146])... 

For the supermolecules with periodic ordered structure, electron diffraction is an indispensable analytical method of TEM. Electron diffraction pattern contains information on the crystal structure, lattice repeat distance, and specimen shape. The pattern is always related to the image of the area of the specimen. There are basically two types of electron diffraction methods, selected area electron diffraction (SAED) and nanobeam electron diffraction (NEED), in which size of the area is of submicrometer scale in the former and of nanometer scale in the latter. In addition, two spectroscopic measurements done by using the TEM apparatus, EELS and EDS, are effective for structural analysis of the specimen. 

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