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Multilayer Imaging

The Image Resolution Concept Monolayer and Multilayer Image Analysis... [Pg.84]

FSIW-EFA can also be used in multilayer images, taking into account the 3-D neighborhood of the voxels to build the small windows to be PCA-scanned [70]. [Pg.89]

Figure 2.16a shows the distribution maps and pure spectra for the multilayer image analysis. Although, the visual difference in distribution maps between individual and multi-image resolution may seem small, there is only a single set of pure spectra, representative of the whole sample. Figure 2.16b shows the... [Pg.101]

Fig. 5.3-36 Structural (a) and magnetic (b) images of an array of single-domain dots with a 60 nm pitch prepared by nanoimprinting and coating with a (Pt/Co) multilayer. Images obtained by atomic and magnetic force microscopy... Fig. 5.3-36 Structural (a) and magnetic (b) images of an array of single-domain dots with a 60 nm pitch prepared by nanoimprinting and coating with a (Pt/Co) multilayer. Images obtained by atomic and magnetic force microscopy...
Hyperspectral images are often displayed as cubes where two dimensions are the pixel coordinates x and y) and the third dimension is the spectral coordinate. When we deal with a multilayer image, we should imagine a hypercube with three spatial directions (the x-, y-, and z-voxel coordinates) and the spectral direction. [Pg.58]

FSIW-EFA can also be used in multilayer images, taking into account the 3D neighborhood of the voxels to build the small windows to be PCA scanned [112]. In this context, a number of local rank maps equal to the number of layers in the image are obtained. It is important to note that the information in the local rank map of a particular layer has been obtained taking into consideration the pixels of that layer and those in the neighboring layers in the depth direction. [Pg.86]

K Cgq multilayers, direct imaging with scanning tunneling microscopy Science 253 429-33... [Pg.2427]

Defect imaging and characterization atomic arrangements in amorphous materials and multilayers concentration profiles with depth film thickness measurements... [Pg.16]

Fig. 2.43. EFTEM images and corresponding line profiles of oxidized AIAs/(AI,Ga)As multilayers. Fig. 2.43. EFTEM images and corresponding line profiles of oxidized AIAs/(AI,Ga)As multilayers.
We produced multilayer tubes with diameters between 20 A and 70 A and up to 2000 A in length [4]. An STM image of such tubes is shown in Fig. 3. The cylindrical shapes are well displayed. [Pg.66]

Figure 35 shows the optical microscopic images of the first crack point on the sample surface. The scratch scar of monolayer Sample 1 has the feature of brittleness. However, there is an obvious crack along the scratch scar of Sample 2 before the coating delamination. This indicates that mono-layer Sample 2 has the feature of ductility, and the adhesion between the film and the substrate is poor. However, there is no obvious crack before the delamination in the scratch scars of other samples. The feature of multilayer Samples 3 and 4 is different from monolayer Samples 1 and 2. There are no obvious cracks in the scratch scars of Samples 5 and 6, except several small cracks along the edge of the scars. These... [Pg.203]

Fig. 47—Images of scratching scar of Fe-N/Ti-N multilayers, Fe-N and Ti-N film as well as Si (111) wafer. (Load, 250 aN, 500 aN, 750 aN, 1,000 aN, 1,250 aN from right to left, respectively). Fig. 47—Images of scratching scar of Fe-N/Ti-N multilayers, Fe-N and Ti-N film as well as Si (111) wafer. (Load, 250 aN, 500 aN, 750 aN, 1,000 aN, 1,250 aN from right to left, respectively).

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See also in sourсe #XX -- [ Pg.27 , Pg.31 ]




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