Microscope: electron 221 image optical

Physical testing appHcations and methods for fibrous materials are reviewed in the Hterature (101—103) and are generally appHcable to polyester fibers. Microscopic analyses by optical or scanning electron microscopy are useful for evaluating fiber parameters including size, shape, uniformity, and surface characteristics. Computerized image analysis is often used to quantify and evaluate these parameters for quaUty control. 

Fig. 14 Scanning electron microscopic (SEM) images of a spiral coil (top) [20] and a microscale bull (bottom) [7,167] made by two-photon radical polymerization of the SCR500 resin. Reproduced from [7,20] with kind permission of Springer Science and Business Media, and of the Optical Society of America...

The first electron microscope was built in Germany in 1931 by Knoll and Ruska (Ref 2). Its principles were based on previous works of L. de Broglie (1924), Busch(1926) and others. The first electron microscopes gave images inferior to those obtained by optical microscopes, but by 1934 a quite satisfactory instrument was obtained by B. von Borries, E. Ruska and M. Knoll. Commercial production of electron microscopes was begun in 1939 by Si emens and Halske, AG, Berlin. These instruments (the total number built was about 30) used electromagnetic.lenses... 

In addition, the optical properties of these materials, which include luminescence and thermochromism, are promising for optoelectronic applications, specifically the TCNQ species as a candidate for new semiconducting materials in view of the clear scanning electron microscope (SEM) image observed for crystals of this product.173... 

Several plagioclasc grains from annealed samples as well as shock-loaded run products were embedded in epoxy resin and polished. Observation was performed with an optical microscope using reflected and transmitted light Major and minor element compositions were determined by an electron probe microanalyzer. Shock textures were also examined in detail with a scanning electron microscope using back-scattered electron images. 

Figure 1.45 Optical path in the confocal microscope. (Reproduced with permission from D.B. Murphy, Fundamentals of Light Microscopy and Electronic Imaging, Wiley-Liss. 2001 John Wiley Sons Inc.)...

Figure 3.8 (a) Optical, and (b) scanning electron microscope (SEM) images for microfluidically aligned shell-cross-linked PI32o-h-PFS53 nanocylinders. (From Wang and Manners.26 Reproduced with permission.)... 

Analysis can be performed directly with the optical microscope which is an integral part of the computer based system. Images obtained from other imaging systems (scanning electron microscope, transmission electron microscope, electron probe x-ray microanalyzer, etc.) can also be processed with the image analysis system. 

Fig. 11.3 CHQ piano-spherical convex lenses, (a) Scanning electron microscope (SEM) image of a CHQ nanolens, (b) Optical microscope (OM) image of a CHQ nanolens placed on a glass substrate with Palladium stripe patterns. It shows that the high resolution of CHQ nanolens to resolve sub-diifraction limit patterns. Inset, SEM image corresponding to (b) (Reproduced from Ref. [4] with kind permission of Nature Publishing Group)...

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