Material properties measuring

Additional suggested resources for the reader include introductory articles on scanning probe techniques for materials properties measurement [82,83J. A comprehensive manual describing various surface preparation techniques, experimental procedures and instrumentation is also a good resource [84J, although the more recent modulation based techniques are not covered. Key textbooks include Johnson s on contact mechanics [51J and Israelachvili s on surface forces [18J, as well as a treatment of JKR/DMT issues by Maugis [85J. 

Burnham, N.A., Kulik, A.J., Oulevey, F., Mayencourt, C., Gourdon, D., Dupas, E. and Gremaud, G., A beginner s guide to LPM materials properties measurements. Part II Materials properties measurements. In Bhushan, B. (Ed.), NATO ASI. Kluwer Academic Publishers, Portugal, 1997, pp. 439-454. 

Reference measurement methods, maintained appropriately by reference laboratories. Most measurements belong to this group, because there are still limited the availability of CRM and Reference System applicable to chemical and materials property measurements. These measurements should be carried out by laboratories that have competence in maintaining measurement methods supported by a series of measurements with demonstrable traceability to SI. 

Material Property measured Heating conditions Time range Temperature range,°C. Activation energy, kcal./mole Rate constant (per hr. at 150°C.)... 

Table 1 shows preliminary materials properties measured on non-optimized bipolar plate materials produced through initial development work at PFCT Comparisons with published DOE goals are made in the table. Sealing of the plate through - through plate permeability is accomplished through the application... 

These recent studies provide a framework for micromechanical analyses using material properties measured on the microstructural level. They also point to using nano-scale measurements, such as those provided by atomic force microscopy (AFM), to analyze the mechanics of bone on the smallest unit of structure shown in Figure 47.1. 

N.A. Burnham, G. Gremaud, A.J. Kuhk, P.J. Gallo, and F, Oulevey, Materials properties measurements Choosing the optimal scanning probe microscope configuration, J. Vac. Sci. Technol. B Microelectr. Nanometer Structures, 14(2), 1308-1312 (1996). 

Table 17.1 lists typical thermal conductivity values important to PCB and electronic components. Where a range of material properties is given, multiple factors determine the exact thermal conductivity value. These factors can include the filler percentage and composition in a polymer, or in the case of silicon (Si), the doping type and level. Material property measurement or vendor data should be used to determine the thermal conductivity of the specific material of interest. One alloy of Cu is shown to demonstrate that the Cu alloy... 

Osterberg, P. M. and Senturia, S. D. (1997), M-TEST A test chip for MEMS material property measurement using electrostatically actuated test structures. Journal of Microelectromechanical Systems 6, 107-118. 

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