Magnetic scanning electron microscopy

A Dektak siuface profilometer was used to measure the etch rates. The profiles of the etched films were observed by field emission scanning electron microscopy (FESEM). In addition, x-ray photoelectron spectroscopy PCPS) was utilized to examine the existence of possible etch products or redeposited materials, and to elucidate the etch mechanism of Co2MnSi magnetic films in a CVOa/Ar plasma. 

A number of techniques have been employed that are capable of giving information about amorphous phases. These include infrared spectroscopy, especially the use of the attenuated total reflection (ATR) or Fourier transform (FT) techniques. They also include electron probe microanalysis, scanning electron microscopy, and nuclear magnetic resonance (NMR) spectroscopy. Nor are wet chemical methods to be neglected for they, too, form part of the armoury of methods that have been used to elucidate the chemistry and microstructure of these materials. 

Other advances in mesoscopic measurements include the application of magnetic resonance imaging (MRI) to study real-time hydrate growth from ice particles and water droplets, andparticle morphology (Moudrakovski et al., 2004). Scanning electron microscopy has also been shown to be a useful tool for studying natural... 

Adsorption (Chemical Engineering) Batch Processing Catalysis, Homogeneous Catalysis, Industrial Electrochemistry Infrared Spectroscopy Mossbauer Spectroscopy Nuclear Magnetic Resonance Raman Spectroscopy Scanning Electron Microscopy Surface Chemistry... 

The dispersion morphology of prepared materials was studied with a multitechnique approach, by means of rheology, scanning electron microscopy (SEM), x-ray diffraction (XRD), and nuclear magnetic resonance (NMR). The results of these tests showed that the so formulated PA6 nanocomposites used in the present study are fully exfoliated [1,2],... 

In the author s opinion, the better approach to experimentally study the morphology of the silica surface is with the help of physical adsorption (see Chapter 6). Then, with the obtained, adsorption data, some well-defined parameters can be calculated, such as surface area, pore volume, and pore size distribution. This line of attack (see Chapter 4) should be complemented with a study of the morphology of these materials by scanning electron microscopy (SEM), transmission electron microscopy (TEM), scanning probe microscopy (SPM), or atomic force microscopy (AFM), and the characterization of their molecular and supramolecular structure by Fourier transform infrared (FTIR) spectrometry, nuclear magnetic resonance (NMR) spectrometry, thermal methods, and possibly with other methodologies. 

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