Light INDEX

The physics of X-ray refraction are analogous to the well known refraction of light by optical lenses and prisms, governed by Snell s law. The special feature is the deflection at very small angles of few minutes of arc, as the refractive index of X-rays in matter is nearly one. Due to the density differences at inner surfaces most of the incident X-rays are deflected [1]. As the scattered intensity of refraction is proportional to the specific surface of a sample, a reference standard gives a quantitative measure for analytical determinations. 

The detailed examination of the behavior of light passing through or reflected by an interface can, in principle, allow the determination of the monolayer thickness, its index of refiraction and absorption coefficient as a function of wavelength. The subjects of ellipsometry, spectroscopy, and x-ray reflection deal with this goal we sketch these techniques here. 

In ellipsometry monochromatic light such as from a He-Ne laser, is passed through a polarizer, rotated by passing through a compensator before it impinges on the interface to be studied [142]. The reflected beam will be elliptically polarized and is measured by a polarization analyzer. In null ellipsometry, the polarizer, compensator, and analyzer are rotated to produce maximum extinction. The phase shift between the parallel and perpendicular components A and the ratio of the amplitudes of these components, tan are related to the polarizer and analyzer angles p and a, respectively. The changes in A and when a film is present can be related in an implicit form to the complex index of refraction and thickness of the film. 

Brewster angle microscopy takes advantage of the reflectivity behavior of light at an interface. This method relies on the fact that light passing from a material of lower refractive index, no into a medium of higher index i will have... 

Up to this point, we have calculated the linear response of the medium, a polarization oscillating at the frequency m of the applied field. This polarization produces its own radiation field that interferes with the applied optical field. Two familiar effects result a change in tlie speed of the light wave and its attenuation as it propagates. These properties may be related directly to the linear susceptibility The index of... 

Figure Bl.26.9. Schematic diagram showing the reflection of light incident at an angle from a medium with refractive index n tln-ough a film of thickness d with refractive index n. ...

Figure Bl.26.11. Diagram showing light impinging from a material of refractive index n at an angle 0j onto a material with refractive index 1I2 and reflected at an angle 0. and transmitted at an angle 0. ...

---