Interfaces in Materials

L. Holland. Vacuum Deposition of Thin Films, Chapman and Hall, London (1966) TS 695 H6. J.P. Hirth and M. Pound. Condensation and Evaporation, Pergamon Press New York (1963). J.M. Howe. Interfaces in Materials, J. Wiley and Sons, New York (1997) QC 173.4.157 H68. A.V. Goldstein (ed.). Handbook of Nanomaterials, Marcel Dekker, New York (1997) TA418.9. 

J. M. Howe, Interfaces in Materials. New York John Wiley Sons, 1997. 

SIMS and SNMS are versatile analytical techniques for the compositional characterization of solid surfaces and interfaces in materials research.92-94 As one of the most important applications, both surface analytical techniques allow depth profile analysis (concentration profile as a function of the depth analyzed) to be performed in materials science and the semiconductor industry with excellent depth resolution in the low nm range. For depth profiling in materials science, dynamic SIMS and SNMS using high primary ion beam doses are applied. Both techniques permit the analysis of light elements such as H, , C and N, which are difficult to measure with other analytical techniques. 

For convenience in this appendix, we refer to all interfaces in materials, including free surfaces and internal interfaces, simply as interfaces. 

J.M. Howe, Interfaces in Materials Atomic Structure, Thermodynamics and Kinetics of Solid-Vapor, Solid-Liquid and Solid-Solid Interfaces (Wiley, New York 1997)... 

The specific interface in materials with nanodomains being very large, it is indispensable to stabilize it sufficiently in order to achieve thermodynamically stable systems. The interface per volume is given by A =D/R where D is the dimensionaUty of the domains (D=3 for spheres, D=2 for cylinders, D=l for lamellae), is the volume fraction of the nanodomains, and R is the radius or half diameter of the domain. Thus a material with spherical domains (D=3) of... 

Howe, J. M., Interfaces in Materials, John Wiley Sons, New York, 1997. Lupis, C. H. P., Chemical Thermodynamics of Materials, Elsevier Science Publishing, New York, 1983. 

Howe, J.M. (1997) Interfaces in Materials, John Wiley Sons, Inc., New York. 

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