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Impurity ionization energy

Free electrons and holes produced by photoexcitation with energies above Eg can form free exciton (see Sect. 3.3.2), but a free electron (hole) can also recombine with a hole (electron) of a neutral acceptor (donor). The energy of the photon produced by this e-A0 or AD° recombination is Eg — E1 + k T/2 where A is the ionization energy of the acceptor or of the donor and T the electron or hole temperature, which is close to the lattice temperature for moderate excitations close to Es. In high-purity samples and at very low temperature, these lines can be sharp and when identified, they allow a good estimation of the impurity ionization energies when the value of Eg is known accurately. [Pg.14]

The electronic conductivity of pure, stoichiometric ZnO is still unknown. The concentration of foreign admixtures in undoped crystals is of the order of 10 -10 cm . Since Eg opt = 3.2eV and impurity ionization energies are about 0.01-0.1 eV at temperatures below 900 K, impurity conduction is always observed. At temperatures above 900 K, dissociation of the intrinsic material occurs. [Pg.670]

The different polytypes exhibit different electronic and optical properties. The bandgaps at 4.2 K of the different polytypes range between 2.39 eV for 3C-SiC and 3.33 eV for the 2H-SiC polytype. The important polytypes 6H-SiC and 4H-SiC have bandgaps of 3.02 eV and 3.27 eV, respectively. All polytypes are extremely hard, chemically inert, and have a high thermal conductivity. Properties such as the breakdown voltage, the saturated drift velocity, and the impurity ionization energies are all specific for the different polytypes. [Pg.626]

The ionization energies and impurity levels are shown in the flat-band figure next to the configuration diagram. [Pg.2886]

Information on ionization energies, solubiUties, diffusion coefficients, and soHd—Hquid distribution coefficients is available for many impurities from nearly all columns of the Periodic Table (86). Extrinsic Ge and Si have been used almost exclusively for infrared detector appHcations. Of the impurities,... [Pg.435]

FAB produces a variety of ions depending on the polarity and on the ionization energy of the analyte as well as on the presence or absence of impurities such as alkali metal ions. [138] However, with some knowledge of the types of ions formed, reasonable compositions can be assigned to the signals (Table 9.1). [Pg.402]

Impurities, such as grit, shreds of cotton, even in small quantities, sensitize an expl to frictional impact. That is why utmost cleanliness must be exercised in the preparation of expls. There are differences in the sensitivity of azides to mechanical and thermal influences. They have been correlated with the structure of the outer electronic orbits, the electrochemical potential, the ionization energy and the arrangement of atoms within the crystal. Functions of the polarizability of the cation are the plastic deformability of the crystals, and their surface properties. The nature of cation in an azide, such as Pb(Nj)2, has little effect on the energy released by the decomposition, which is vested in the N ion. The high heat of formation of the N2 molecule accounts... [Pg.514]

The advantages and disadvantages of most of the techniques dealt with in this report have already been discussed in their respective sections. However, it is perhaps useful to compare their relative utilities in determining certain useful quantities, such as, e.g., impurity concentrations, or ionization energies. The discussion in this section will be brief and mostly qualitative, and it must be remembered that some of the conclusions drawn may be more subjective than hard and firm. [Pg.121]

In most semiconductors, there are, in addition to the allowed energy levels for electrons in the conduction and filled bands of the ideal crystal, discrete levels with energies in the forbidden gap which correspond to electrons localized at impurity atoms or imperfections. In zinc oxide, such levels arise when there are excess zinc atoms located interstitially in the lattice. At very low temperatures the interstitial zinc is in the form of neutral atoms. However, the ionization energy of the interstitial atoms in the crystal is small and at room temperature most are singly ionized, their electrons being thermally excited into the conduction band. These electrons give rise to the observed A-type conductivity. [Pg.261]

An increase of the photocurrent at energies less than 2 eV was observed [151,152] unlike the previous result. This was attributed to the localized impurity ionization up to 0.8 eV below the conduction band. The crystals are considered as model systems for the one and three-dimensional versions of Onsager s theory of germinate recombination. [Pg.35]

Fig. 4. The scheme of electron bands in a semiconductor. 1, Impurity level located near the bottom of the conduction band 2, 3, impurity levels located near the top of the valence band. Ie is the electron ionization energy, Ih is the hole ionization energy, and Es is the width of the forbidden gap. The exothermal electron transfer reaction in the vicinity of the top of the valence band is shown by the arrow. Fig. 4. The scheme of electron bands in a semiconductor. 1, Impurity level located near the bottom of the conduction band 2, 3, impurity levels located near the top of the valence band. Ie is the electron ionization energy, Ih is the hole ionization energy, and Es is the width of the forbidden gap. The exothermal electron transfer reaction in the vicinity of the top of the valence band is shown by the arrow.
The bivalent substitutional impurities of group-IVA elements such as C, Si, Ge, Sn, or Pb also produced double shallow acceptor levels with the ionization energy of 0.721 eV for C, 0.919 eV for Si, 0.792 eV for Ge, 1.034 eV for Sn, and 1.283 eV for Pb, respectively. Some bivalent substitutional impurities of another type of group-VIIIA elements such as Ne, Ar, Kr, or Xe did not produce any energy levels in the band gap by the substituting host O atom. As expected, the acceptor levels produced by the impurities of group-VA and -IVA elements at the O site were single or double acceptors, respectively. Quantitave analysis of these shallow acceptors produced by the monovalent and bivalent substitutional impurities will be made in Section 4.2. [Pg.331]


See other pages where Impurity ionization energy is mentioned: [Pg.56]    [Pg.337]    [Pg.12]    [Pg.104]    [Pg.12]    [Pg.104]    [Pg.273]    [Pg.274]    [Pg.278]    [Pg.56]    [Pg.337]    [Pg.12]    [Pg.104]    [Pg.12]    [Pg.104]    [Pg.273]    [Pg.274]    [Pg.278]    [Pg.2886]    [Pg.435]    [Pg.157]    [Pg.237]    [Pg.157]    [Pg.106]    [Pg.59]    [Pg.48]    [Pg.262]    [Pg.277]    [Pg.23]    [Pg.44]    [Pg.489]    [Pg.1279]    [Pg.1280]    [Pg.208]    [Pg.177]    [Pg.215]    [Pg.193]    [Pg.48]    [Pg.145]    [Pg.330]    [Pg.331]    [Pg.331]   
See also in sourсe #XX -- [ Pg.88 , Pg.94 , Pg.95 ]

See also in sourсe #XX -- [ Pg.104 , Pg.129 ]

See also in sourсe #XX -- [ Pg.104 , Pg.129 ]




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