Imaging, electric field

With low frequency electric fields breaking the centro-symmetry, SHG can also be generated due to low frequency electric field even in centro-symmetric media, providing a tool to image electric fields. This process is usually described as a third-order nonlinear process with a third-order nonlinear polarization tensor, a tensor of fourth rank, described by... 

The field ion microscope (FIM) has been used to monitor surface self-diflfiision in real time. In the FIM, a sharp, crystalline tip is placed in a large electric field in a chamber filled with Fie gas [14]. At the tip. Fie ions are fonned, and then accelerated away from the tip. The angular distribution of the Fie ions provides a picture of the atoms at the tip with atomic resolution. In these images, it has been possible to monitor the diflfiision of a single adatom on a surface in real time [15]. The limitations of FIM, however, include its applicability only to metals, and the fact that the surfaces are limited to those that exist on a sharp tip, i.e. difhision along a large... 

Tang S L, McGhie A J and Suna A 1993 Molecular-resolution imaging of insulating macromolecules with the scanning tunnelling microscope via a nontunnelling, electric-field-induced mechanism Phys. Rev. B 47 3850... 

One important sem source that is not based on thermionic emission is the field emission (fe) source. Fe-sem systems typically give images of much higher resolution than conventional sems due to the much narrower energy distribution (on the order of 0.25 eV) of the primary electron beam. A fe source is a pointed W tip from which electrons tunnel under the influence of a large electric field. This different mechanism of electron generation also results in a brightness comparable to a conventional thermionic source with much less current. 

The electric field that generates the multipoles does not have to be externally applied. Rather, the image charge generated by the particle causes a non-uniform electric field that, not only polarizes the particle, but can result in attractive forces. 

These Schottky energy barriers are measured in the presence of an electric field in the structure which is necessary to be able to collect the photocurrent. The photocurrent thresholds are not the zero electric field Schottky barriers because of the electric field in the polymer and the image chaise potential created when the electron leaves the metal. This effect results in a lowering of the Schottky energy barrier given by [34]... 

The reason for the success of this type of data fitting is that for moderately large barriers it becomes unimportant whether escape for the image potential is treated within the framework of the Onsager or the RS model. An indication that the Onsager description is, nevertheless, more appropriate is the intersection of j(/ ) curves for variable temperature at high electric fields. This is a characteristic feature of Onsager processes 24J. 

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