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Electric field imaging mode

Keywords Atomic force microscopy Charge dissipation Charge domains Electric charges on polymer surfaces Electric field imaging mode Surface potential imaging mode... [Pg.48]

In this chapter, we have provided an overview of near-field imaging and spectroscopy of noble metal nanoparticles and assemblies. We have shown that plasmon-mode wavefunctions and enhanced optical fields of nanoparticle systems can be visualized. The basic knowledge about localized electric fields induced by the plasmons may lead to new innovative research areas beyond the conventional scope of materials. [Pg.51]

Beyond imaging many more applications of SPM exist [1, 16, 17]. Each SPM realization has a spectroscopy mode where, for example, one parameter is determined as a function of another (e.g. current as a function of voltage) [18, 19]. Objects of nanometer size, can be moved (manipulated) with the scanning probe tips through the forces acting between the tip (or the electric field of the tip) and the objects [20-22]. Additionally on-site on-time [23], and even "real-time [24] observation of the processes on surfaces, e.g. adsorbate diffusion, is possible. On top of this, nano-lithography can be performed both with STM and AFM [25, 26]. [Pg.339]

Electrostatic Force Microscopy (EFM) allows to obtain information on the surface electrical properties of materials by measuring electric forces between a charged tip and the surface. It is particularly suitable for the study and manipulation of ferroelectric thin films with large surface charge. Interestingly, an EFM can also be used to study the surface properties of dielectric materials, that are polarized by the electric field of the tip. In this mode of operation, the EFM is sometimes called Polarization Force Microscope and can be used to study and image even air-liquid interfaces [64]. [Pg.104]


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See also in sourсe #XX -- [ Pg.48 ]




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