High-resolution scans spectroscopy

Analysis methods, used for the investigation of modified surfaces and interfaces, are briefiy reviewed. Emphasis is on the combination of chemical, structural/ morphological, electronic, and optical characterization. Many techniques such as transmission electron microscopy (TEM), standard X-ray photoelectron spectroscopy (XPS) using A1 or Mg K radiation, high-resolution scanning electron microscopy (HRSEM), and standard scanning probe microscopies (AEM in contact... 

Without going into any further detail, we will mention one other type of interferometer that is encountered in molecular spectroscopy experiments, namely the scanning Michelson interferometer (for detailed descriptions refer to standard textbooks on optics or laser spectroscopy). These are used in so-called Fourier transform spectrometers for high-resolution molecular spectroscopy in the IR such instruments are commonly known as FTIR spectrometers. While rather popular in analytical molecular spectroscopy of IR wavelengths, namely to record, identify and quantify molecular vibrations, they are less suitable in laser chemistry experiments because of the rather long acquisition times required to record... 

While method (a) is often used for high-resolution fluorescence spectroscopy with slow scan rates or for tuning pulsed dye lasers, method (b) is realized in a scanning confocal FPI (used as an optical spectrum analyzer) for monitoring the mode structure of lasers. 

The development of better analytical tools in recent years has enabled durability investigators to better understand that these specially prepared surfaces have unique surface geometries which can mechanically interact with the adhesive as well as provide a readily wettable surface. For many years the surfaces of metals were studied by electron microscopy, scanning electron microscopy, and electron diffraction techniques. Today these techniques have been supplemented by Auger electron spectroscopy (AES), electron spectroscopy for chemical analysis (ESCA), secondary ion mass spectroscopy (SIMS), X-ray emission spectroscopy (XES), X-ray photoelectron spectroscopy (XPS), and high-resolution scanning electron microscopy (XSEM). For more details the reader is referred to articles on the subject by Buckley( 3) and Davis and Venables.(54) (See also Chapters 6 and 7.)... 

X-ray photoelectron spectroscopy (XPS) XPS is a surface analysis technique that can be used to ascertain surface elemental composition and types of bonds present on the surface. It is also a straightforward, easy, and non-destructive characterization technique. In XPS, different scan resolutions lead to different information. On the one hand, a low-resolution scan can provide the percent of each element, as well as their atomic concentrations. On the other hand, a high-resolution scan can give the types of bonds and concentrations on the surface. Take carbon (Cis) as an example, its high resolution scans can be divided into four components peaks around 285.0, 286.5, 228.0, and 289.5 eV. These subpeaks are Cl (C-C or C-H), C2 (C-OH), C3 (O-C-O or C=0), and C4 (0-C=0), respectively. XPS has frequently been applied to confirm the chemical changes of polymer or fiber after treatment. In addition. XPS can be used to verify the occurrence of surface... 

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