Glow discharge mass analyzers

Fig. 120. Glow discharge mass spectrometry. A Sector field based instrument (a) glow discharge source (b) magnetic sector field (c) electrostatic energy analyzer (d) Daly detector (e) ...

GDMS Glow Discharge Mass Spectroscopy Sample forms the cathode for a D.C. glow discharge Sputtered atoms ionized in plasma Ions - analyzed in mass spectrometer 0.1-100 pm 3-4 mm (Bulk) trace element analysis deleclion limit sub-ppb 9,10... 

Secondary Neutral Mass Spectrometry and Glow Discharge Mass Spectrometry. SNMS and GDMS are group>ed together because of the close similarities in principle between them. In both techniques the surface to be analyzed is sputtered and the contribution to the sputtered flux of secondary neutrals is measured. They differ in the methods used to measure the secondary neutral flux. In GDMS, as in GDOS, atoms are sputtered... 

Xing, Y. Xiaojia, L. Haizhou, W. Determination of Trace Elements and Correction of Mass Spectral Interferences in Superalloy Analyzed by Glow Discharge Mass Spectrometry. Eur. J. Mass Spectrom. 2008,74,211-218. 

Glow discharge mass spectrometry (GDMS) An analytical technique where atoms are sputtered from a surface, ionized in the plasma, then mass analyzed in a mass spectrometer. 

At present GDMS164 165 is one of the most powerful solid-state analytical methods for the direct determination of trace impurities and depth profiling of solids. The positively charged ions formed in the low pressure argon plasma of the glow discharge are extracted and accelerated into the double-focusing sector field mass spectrometer, quadrupole, ion trap or ToF mass analyzer. 

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